In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate
2009 ◽
Vol 72
(3)
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pp. 216-222
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2019 ◽
Vol Volume 14
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pp. 371-382
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1994 ◽
Vol 219
(3-4)
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pp. 457-464
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