Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

G. H. Buh; H. J. Chung; C. K. Kim; J. H. Yi; I. T. Yoon; Y. Kuk

doi:10.1063/1.126892

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.126892 ◽

2000 ◽

Vol 77 (1) ◽

pp. 106-108 ◽

Cited By ~ 40

Author(s):

G. H. Buh ◽

H. J. Chung ◽

C. K. Kim ◽

J. H. Yi ◽

I. T. Yoon ◽

...

Keyword(s):

Kelvin Probe Force Microscopy ◽

Applied Bias ◽

Kelvin Probe ◽

Scanning Capacitance Microscopy ◽

Force Microscopy ◽

Pn Junction

Download Full-text

Investigation of an n− layer in a silicon fast recovery diode under applied bias voltages using Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.7567/jjap.57.08nb11 ◽

2018 ◽

Vol 57 (8S1) ◽

pp. 08NB11 ◽

Cited By ~ 3

Author(s):

Takeshi Uruma ◽

Nobuo Satoh ◽

Hidekazu Yamamoto ◽

Futoshi Iwata

Keyword(s):

Kelvin Probe Force Microscopy ◽

Fast Recovery ◽

Applied Bias ◽

Kelvin Probe ◽

Force Microscopy

Download Full-text

Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.113780 ◽

1995 ◽

Vol 66 (25) ◽

pp. 3510-3512 ◽

Cited By ~ 241

Author(s):

Atsushi Kikukawa ◽

Sumio Hosaka ◽

Ryo Imura

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Pn Junction

Download Full-text

Electrical characterization of an operating Sipn-junction diode with scanning capacitance microscopy and Kelvin probe force microscopy

Journal of Applied Physics ◽

10.1063/1.1375803 ◽

2001 ◽

Vol 90 (1) ◽

pp. 443-448 ◽

Cited By ~ 27

Author(s):

G. H. Buh ◽

H. J. Chung ◽

J. H. Yi ◽

I. T. Yoon ◽

Y. Kuk

Keyword(s):

Electrical Characterization ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Scanning Capacitance Microscopy ◽

Force Microscopy ◽

Junction Diode

Download Full-text

Characterization of Al-doped ZnTe layer using scanning capacitance microscopy and Kelvin probe force microscopy

Journal of Physics Conference Series ◽

10.1088/1742-6596/61/1/230 ◽

2007 ◽

Vol 61 ◽

pp. 1162-1166 ◽

Cited By ~ 1

Author(s):

Tooru Tanaka ◽

Qixin Guo ◽

Mitsuhiro Nishio ◽

Hiroshi Ogawa

Keyword(s):

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Scanning Capacitance Microscopy ◽

Force Microscopy

Download Full-text

Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2013.08.115 ◽

2014 ◽

Vol 557 ◽

pp. 249-253 ◽

Cited By ~ 3

Author(s):

Roland Nowak ◽

Daniel Moraru ◽

Takeshi Mizuno ◽

Ryszard Jablonski ◽

Michiharu Tabe

Keyword(s):

Photovoltaic Effect ◽

Kelvin Probe Force Microscopy ◽

Potential Profile ◽

Kelvin Probe ◽

Force Microscopy ◽

Pn Junction

Download Full-text

Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

Applied Surface Science ◽

10.1016/j.apsusc.2004.03.249 ◽

2004 ◽

Vol 235 (4) ◽

pp. 507-512 ◽

Cited By ~ 42

Author(s):

A. Doukkali ◽

S. Ledain ◽

C. Guasch ◽

J. Bonnet

Keyword(s):

Cross Section ◽

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Pn Junction ◽

Potential Mapping ◽

Surface Potential Mapping

Download Full-text

Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy

2018 International Symposium on Micro-NanoMechatronics and Human Science (MHS) ◽

10.1109/mhs.2018.8887070 ◽

2018 ◽

Author(s):

Takeshi Uruma ◽

Nobuo Satoh ◽

Hidekazu Yamamoto ◽

Futoshi Iwata

Keyword(s):

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Fast Recovery ◽

Applied Bias ◽

Kelvin Probe ◽

Potential Measurement ◽

Force Microscopy

Download Full-text

Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

Download Full-text

Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

Download Full-text

Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

Download Full-text