Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy

1995 ◽  
Vol 66 (25) ◽  
pp. 3510-3512 ◽  
Author(s):  
Atsushi Kikukawa ◽  
Sumio Hosaka ◽  
Ryo Imura
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Pn Junction

Potential profile and photovoltaic effect in nanoscale lateral pn junction observed by Kelvin probe force microscopy

2014 ◽  
Vol 557 ◽  
pp. 249-253 ◽  
Author(s):  
Roland Nowak ◽  
Daniel Moraru ◽  
Takeshi Mizuno ◽  
Ryszard Jablonski ◽  
Michiharu Tabe
Keyword(s):  
Photovoltaic Effect ◽  
Kelvin Probe Force Microscopy ◽  
Potential Profile ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Pn Junction

Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

2000 ◽  
Vol 77 (1) ◽  
pp. 106-108 ◽  
Author(s):  
G. H. Buh ◽  
H. J. Chung ◽  
C. K. Kim ◽  
J. H. Yi ◽  
I. T. Yoon ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Applied Bias ◽  
Kelvin Probe ◽  
Scanning Capacitance Microscopy ◽  
Force Microscopy ◽  
Pn Junction

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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