Scanning SQUID microscopy of integrated circuits

2000 ◽  
Vol 76 (16) ◽  
pp. 2304-2306 ◽  
Author(s):  
S. Chatraphorn ◽  
E. F. Fleet ◽  
F. C. Wellstood ◽  
L. A. Knauss ◽  
T. M. Eiles
Keyword(s):  
Integrated Circuits ◽  
Scanning Squid ◽  
Scanning Squid Microscopy

Failure Analysis of Short Faults on Advanced Wire-Bond and Flip-Chip Packages with Scanning SQUID Microscopy

2004 ◽  
Author(s):  
Steve K. Hsiung ◽  
Kevan V. Tan ◽  
Andrew J. Komrowski ◽  
Daniel J. D. Sullivan ◽  
Jan Gaudestad
Keyword(s):  
Magnetic Fields ◽  
Integrated Circuits ◽  
Quantum Interference ◽  
Flip Chip ◽  
Infrared Emission ◽  
Fault Analysis ◽  
Wire Bond ◽  
Overlay Design ◽  
Scanning Squid ◽  
Metal Layers

Abstract Scanning SQUID (Superconducting Quantum Interference Device) Microscopy, known as SSM, is a non-destructive technique that detects magnetic fields in Integrated Circuits (IC). The magnetic field, when converted to current density via Fast Fourier Transform (FFT), is particularly useful to detect shorts and high resistance (HR) defects. A short between two wires or layers will cause the current to diverge from the path the designer intended. An analyst can see where the current is not matching the design, thereby easily localizing the fault. Many defects occur between or under metal layers that make it impossible using visible light or infrared emission detecting equipment to locate the defect. SSM is the only tool that can detect signals from defects under metal layers, since magnetic fields are not affected by them. New analysis software makes it possible for the analyst to overlay design layouts, such as CAD Knights, directly onto the current paths found by the SSM. In this paper, we present four case studies where SSM successfully localized short faults in advanced wire-bond and flip-chip packages after other fault analysis methods failed to locate the defects.

Direct measurement of internal magnetic fields in natural sands using scanning SQUID microscopy

2014 ◽  
Vol 242 ◽  
pp. 10-17 ◽  
Author(s):  
Jan O. Walbrecker ◽  
Beena Kalisky ◽  
Denys Grombacher ◽  
John Kirtley ◽  
Kathryn A. Moler ◽  
...  
Keyword(s):  
Magnetic Fields ◽  
Direct Measurement ◽  
Scanning Squid ◽  
Scanning Squid Microscopy

HTS scanning SQUID microscopy of active circuits

1999 ◽  
Vol 9 (2) ◽  
pp. 4103-4106 ◽  
Author(s):  
E.F. Fleet ◽  
S. Chatraphorn ◽  
F.C. Wellstood ◽  
L.A. Knauss
Keyword(s):  
Active Circuits ◽  
Scanning Squid ◽  
Scanning Squid Microscopy

scholarly journals Limits on the Superconducting Order Parameter in NdFeAsO1-xFy from Scanning SQUID Microscopy

2009 ◽  
Vol 78 (1) ◽  
pp. 013708 ◽  
Author(s):  
Clifford W. Hicks ◽  
Thomas M. Lippman ◽  
Martin E. Huber ◽  
Zhi-An Ren ◽  
Jie Yang ◽  
...  
Keyword(s):  
Order Parameter ◽  
Superconducting Order Parameter ◽  
Scanning Squid ◽  
Scanning Squid Microscopy

Scanning SQUID Microscopy for Sensing Vector Magnetic Field

2018 ◽  
Vol 28 (4) ◽  
pp. 1-5 ◽  
Author(s):  
The Dang Vu ◽  
Masaki Toji ◽  
Atsuki Ito ◽  
Shigeyuki Miyajima ◽  
Thanh Huy Ho ◽  
...  
Keyword(s):  
Magnetic Field ◽  
Vector Magnetic Field ◽  
Scanning Squid ◽  
Scanning Squid Microscopy

scholarly journals Scanning SQUID microscopy in a cryogen-free cooler

2019 ◽  
Vol 90 (5) ◽  
pp. 053702 ◽  
Author(s):  
Yishai Shperber ◽  
Naor Vardi ◽  
Eylon Persky ◽  
Shai Wissberg ◽  
Martin E. Huber ◽  
...  
Keyword(s):  
Scanning Squid ◽  
Scanning Squid Microscopy

Scanning SQUID Microscopy

Science ◽  
1996 ◽  
Vol 272 (5265) ◽  
pp. 1083i-1087
Author(s):  
M. B. Ketchen
Keyword(s):  
Scanning Squid ◽  
Scanning Squid Microscopy
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