Cross-sectional electron-beam-induced current analysis of the passivation of extended defects in cast multicrystalline silicon by remote hydrogen plasma treatment

2000 ◽  
Vol 76 (6) ◽  
pp. 697-699 ◽  
Author(s):  
O. F. Vyvenko ◽  
O. Krüger ◽  
M. Kittler
Keyword(s):  
Electron Beam ◽  
Plasma Treatment ◽  
Hydrogen Plasma ◽  
Multicrystalline Silicon ◽  
Extended Defects ◽  
Induced Current ◽  
Current Analysis ◽  
Cross Sectional ◽  
Electron Beam Induced Current

scholarly journals Study of Low Voltage Prebreakdown Sites in Multicrystalline Si Based Cells by the LBIC, EL, and EDS Methods

2017 ◽  
Vol 2017 ◽  
pp. 1-5 ◽  
Author(s):  
V. I. Orlov ◽  
E. B. Yakimov ◽  
E. P. Magomedbekov ◽  
A. B. Danilin
Keyword(s):  
Electron Beam ◽  
Laser Beam ◽  
Reverse Bias ◽  
Low Voltage ◽  
Depletion Region ◽  
Extended Defects ◽  
Induced Current ◽  
X Ray ◽  
Si Solar Cells ◽  
Electron Beam Induced Current

Breakdown sites in multicrystalline Si solar cells have been studied by reverse-bias electroluminescence, electron beam induced current (EBIC) and laser beam induced current (LBIC), and Energy Dispersive X-Ray Spectroscopy methods. In the breakdown sites revealed by EL at small reverse bias (~5 V), the enhanced aluminum and oxygen concentration is revealed. Such breakdowns can be located inside the depletion region because they are not revealed by the EBIC or LBIC methods. Breakdowns revealed by EL at larger bias correlate well with extended defects in the EBIC and LBIC images.

Electron-beam-induced current study of small-angle grain boundaries in multicrystalline silicon

2005 ◽  
Vol 52 (12) ◽  
pp. 1211-1215 ◽  
Author(s):  
J CHEN ◽  
T SEKIGUCHI ◽  
R XIE ◽  
P AHMET ◽  
T CHIKYO ◽  
...  
Keyword(s):  
Electron Beam ◽  
Grain Boundaries ◽  
Small Angle ◽  
Multicrystalline Silicon ◽  
Induced Current ◽  
Electron Beam Induced Current

Electron-beam-induced current study of grain boundaries in multicrystalline silicon

2004 ◽  
Vol 96 (10) ◽  
pp. 5490-5495 ◽  
Author(s):  
J. Chen ◽  
T. Sekiguchi ◽  
D. Yang ◽  
F. Yin ◽  
K. Kido ◽  
...  
Keyword(s):  
Electron Beam ◽  
Grain Boundaries ◽  
Multicrystalline Silicon ◽  
Induced Current ◽  
Electron Beam Induced Current
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