Thermal-expansion effects in near-field optical microscopy fiber probes induced by laser light absorption

1999 ◽  
Vol 75 (21) ◽  
pp. 3408-3410 ◽  
Author(s):  
P. G. Gucciardi ◽  
M. Colocci ◽  
M. Labardi ◽  
M. Allegrini
Keyword(s):  
Thermal Expansion ◽  
Optical Microscopy ◽  
Light Absorption ◽  
Laser Light ◽  
Near Field ◽  
Fiber Probes

Observation of tip-to-sample heat transfer in near-field optical microscopy using metal-coated fiber probes

2005 ◽  
Vol 86 (20) ◽  
pp. 203109 ◽  
Author(s):  
P. G. Gucciardi ◽  
S. Patanè ◽  
A. Ambrosio ◽  
M. Allegrini ◽  
A. D. Downes ◽  
...  
Keyword(s):  
Heat Transfer ◽  
Optical Microscopy ◽  
Near Field ◽  
Sample Heat ◽  
Coated Fiber ◽  
Fiber Probes

Tapping Mode Near-Field Scanning Optical Microscopy of Molecular Crystals and Thin Films

1999 ◽  
Vol 5 (S2) ◽  
pp. 994-995
Author(s):  
C. Daniel Frisbie ◽  
Andrey Kosterin ◽  
Helena Stadniychuk
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Laser Light ◽  
Near Field ◽  
Sample Surface ◽  
Reflected Light ◽  
Surface Laser ◽  
Scanning Optical Microscopy ◽  
Diffraction Effects ◽  
Near Field Scanning

The diffraction of visible light limits the spatial resolution in conventional optical microscopy to about 200-300 nm. In near-field scanning optical microscopy (NSOM), resolution is improved by bringing the light source, such as the end of an optical fiber, very close to the sample surface. Laser light coupled into the opposite end of the fiber propagates down the fiber core and is emitted from the aperture of the tip. When the sample is in the near-field(roughly within one tip diameter of the end of the tip), the spatial resolution is essentially equal to the diameter of the aperture at the end of the tip and is not determined by diffraction effects. Two-dimensional imaging is accomplished by raster-scanning the sample underneath the fiber tip and collecting transmitted or reflected light at a photodetector.

scholarly journals True Tapping Mode Scanning Near-Field Optical Microscopy with Bent Glass Fiber Probes

Scanning ◽  
2018 ◽  
Vol 2018 ◽  
pp. 1-9
Author(s):  
A. Smirnov ◽  
V. M. Yasinskii ◽  
D. S. Filimonenko ◽  
E. Rostova ◽  
G. Dietler ◽  
...  
Keyword(s):  
Glass Fiber ◽  
Optical Microscopy ◽  
Shear Force ◽  
Near Field ◽  
Double Resonance ◽  
Quartz Tuning Fork ◽  
Tapping Mode ◽  
Bending Radius ◽  
Force Mode ◽  
Fiber Probes

In scanning near-field optical microscopy, the most popular probes are made of sharpened glass fiber attached to a quartz tuning fork (TF) and exploiting the shear force-based feedback. The use of tapping mode feedback could be preferable. Such an approach can be realized, for example, using bent fiber probes. Detailed analysis of fiber vibration modes shows that realization of truly tapping mode of the probe dithering requires an extreme caution. In case of using the second resonance mode, probes vibrate mostly in shear force mode unless the bending radius is rather small (ca. 0.3 mm) and the probe’s tip is short. Otherwise, the shear force character of the dithering persists. Probes having these characteristics were prepared by irradiation of a tapered etched glass fiber with a CW CO2 laser. These probes were attached to the TF in double resonance conditions which enables achieving significant quality factor (4000–6000) of the TF + probe system (Cherkun et al., 2006). We also show that, to achieve a truly tapping character, dithering, short, and not exceeding 3 mm lengths of a freestanding part of bent fiber probe beam should also be used in the case of nonresonant excitation.

scholarly journals Near-field scanning optical microscopy using polymethylmethacrylate optical fiber probes

2010 ◽  
Vol 110 (3) ◽  
pp. 211-215 ◽  
Author(s):  
H. Chibani ◽  
K. Dukenbayev ◽  
M. Mensi ◽  
S.K. Sekatskii ◽  
G. Dietler
Keyword(s):  
Optical Fiber ◽  
Optical Microscopy ◽  
Near Field ◽  
Optical Fiber Probes ◽  
Fiber Probes ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Material and Doping Contrast in Semiconductor Devices at Nanoscale Resolution Using Scattering-Type Scanning Near-Field Optical Microscopy

2006 ◽  
Author(s):  
J. Wittborn ◽  
R. Weiland ◽  
D. Kazantsev ◽  
A. Huber ◽  
R. Hillenbrand ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Cross Sections ◽  
Doping Concentration ◽  
Laser Light ◽  
Near Field ◽  
Semiconductor Devices ◽  
Microelectronic Devices ◽  
20 Nm

Abstract The usefulness of scattering-type near-field optical microscopy for mapping the material and doping in microelectronic devices at nanoscale resolution is demonstrated. Both amplitude and phase of infrared (λ = 10.7 μm) laser light scattered by a metallised, vibrating AFM tip scanned a few nanometers above the sample are detected and transformed into images showing contrast of materials, as well as of doping concentration. Cross-sections through layers as thin as 20 nm have been clearly imaged.

scholarly journals Shape dependent thermal effects in apertured fiber probes for scanning near-field optical microscopy

2006 ◽  
Vol 99 (8) ◽  
pp. 084303 ◽  
Author(s):  
A. Ambrosio ◽  
O. Fenwick ◽  
F. Cacialli ◽  
R. Micheletto ◽  
Y. Kawakami ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Thermal Effects ◽  
Near Field ◽  
Fiber Probes
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