Optical characterization of visible multiquantum-well semiconductor lasers by collection/excitation modes of scanning near-field optical microscopy

1999 ◽  
Vol 74 (19) ◽  
pp. 2746-2748 ◽  
Author(s):  
N. H. Lu ◽  
Din Ping Tsai ◽  
C. S. Chang ◽  
T. T. Tsong
Keyword(s):  
Optical Microscopy ◽  
Semiconductor Lasers ◽  
Near Field ◽  
Optical Characterization ◽  
Multiquantum Well

Near-field optical characterization of visible multiple quantum well semiconductor lasers

1998 ◽  
Author(s):  
Nien H. Lu ◽  
Din Ping Tsai ◽  
F. C. Yeh ◽  
C. S. Chang ◽  
T. T. Tsong ◽  
...  
Keyword(s):  
Quantum Well ◽  
Semiconductor Lasers ◽  
Near Field ◽  
Multiple Quantum Well ◽  
Optical Characterization ◽  
Multiple Quantum

Near-field optical microscopy/spectroscopy of discrete quantum emitters

1994 ◽  
Vol 52 ◽  
pp. 1060-1061
Author(s):  
E. Betzig
Keyword(s):  
Optical Microscopy ◽  
Semiconductor Lasers ◽  
Data Storage ◽  
Single Molecule ◽  
Near Field ◽  
Close Proximity ◽  
Excitation Volume ◽  
Scanning Optical Microscopy ◽  
Quantum Emitters

A subwavelength sized source or detector of visible light can be raster scanned in close proximity to the surface of a sample to generate images at a resolution well beyond the classical diffractional limit. Applications of the resultant technique, near-field scanning optical microscopy (NSOM), include fluorescence imaging of fixed cells, mode profiling of semiconductor lasers, and high density magnetooptic data storage. The focus of this presentation, however, will be on the more recent use of NSOM in the identification and characterization of discrete quantum emitters from within an ensemble.Two such systems will be discussed. The first involves the detection and characterization of single fluorescent molecules. The usual difficulty with single molecule detection is not the inherently weak luminescence signal from each molecule, but rather the large background from impurity luminescence and Raman scattering within the excitation volume. NSOM greatly reduces this volume and hence the resultant background, yielding sensitivity of 0.005 molecules.

scholarly journals Near-field optical microscopy characterization of IC metrology

1994 ◽  
Author(s):  
Ricardo Toledo-Crow ◽  
Bruce W. Smith ◽  
Jon K. Rogers ◽  
Mehdi Vaez-Iravani
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Microscopy Characterization
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