scholarly journals Near-field optical microscopy characterization of IC metrology

1994 ◽  
Author(s):  
Ricardo Toledo-Crow ◽  
Bruce W. Smith ◽  
Jon K. Rogers ◽  
Mehdi Vaez-Iravani
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Microscopy Characterization

Characterization of Nanomaterials by Locally Determining Their Complex Permittivity with Scattering-Type Scanning Near-Field Optical Microscopy

2020 ◽  
Vol 3 (2) ◽  
pp. 1250-1262 ◽  
Author(s):  
Stefan G. Stanciu ◽  
Denis E. Tranca ◽  
Laura Pastorino ◽  
Stefania Boi ◽  
Young Min Song ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Complex Permittivity ◽  
Near Field

scholarly journals Characterization of power induced heating and damage in fiber optic probes for near-field scanning optical microscopy

2007 ◽  
Vol 78 (5) ◽  
pp. 053712 ◽  
Author(s):  
Nicholas E. Dickenson ◽  
Elizabeth S. Erickson ◽  
Olivia L. Mooren ◽  
Robert C. Dunn
Keyword(s):  
Optical Microscopy ◽  
Fiber Optic ◽  
Near Field ◽  
Fiber Optic Probes ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy

2001 ◽  
Vol 40 (28) ◽  
pp. 5040 ◽  
Author(s):  
Gregor Schürmann ◽  
Wilfried Noell ◽  
Urs Staufer ◽  
Nico F. de Rooij ◽  
Rolf Eckert ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Quartz Glass ◽  
Near Field ◽  
Fused Silica ◽  
Silicon Cantilever ◽  
Fabrication And Characterization ◽  
Cantilever Probe

Characterization of a 90° waveguide bend using near-field scanning optical microscopy

2005 ◽  
Vol 87 (19) ◽  
pp. 191107 ◽  
Author(s):  
Guangwei Yuan ◽  
Kevin L. Lear ◽  
Matthew D. Stephens ◽  
David S. Dandy
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Waveguide Bend
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