Fabrication of high-temperature superconducting Josephson junctions on substrates patterned by focused ion beam

1998 ◽  
Vol 73 (12) ◽  
pp. 1730-1732 ◽  
Author(s):  
C.-H. Chen ◽  
I. Jin ◽  
S. P. Pai ◽  
Z. W. Dong ◽  
C. J. Lobb ◽  
...  
Keyword(s):  
High Temperature ◽  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
High Temperature Superconducting

Nanofabrication of Planar High Temperature Superconducting Josephson Junctions Using Focused Ion Beam Technology

2000 ◽  
Vol 636 ◽  
Author(s):  
Hong-Ying Zhai ◽  
Quark Y. Chen ◽  
Jiarui Liu ◽  
Wei-Kan Chu
Keyword(s):  
High Temperature ◽  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Normal Metal ◽  
Structure Modification ◽  
Nano Structure ◽  
Ybco Films ◽  
High Temperature Superconducting ◽  
Local Deposition

AbstractSuperconductor-normal metal-superconductor (SNS) high-Tc Josephson junctions have been fabricated on c-oriented YBa2Cu3O7-δ (YBCO) films. Focused ion beam (FIB) nano-structure modification (cutting of the film and local deposition of a metal) was used to form the junction with tungsten barrier. The junctions exhibit resistively shunted junction (RSJ) -like I-V characteristics.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

PLANAR JOSEPHSON JUNCTIONS FABRICATED BY FOCUSED-ION BEAM

2001 ◽  
Vol 15 (24n25) ◽  
pp. 3359-3360 ◽  
Author(s):  
Hye-Won Seo ◽  
Quark Y. Chen ◽  
Chong Wang ◽  
Wei-Kan Chu ◽  
T. M. Chuang ◽  
...  
Keyword(s):  
Silicon Dioxide ◽  
Josephson Junctions ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Spot Size ◽  
Physical Significance ◽  
Fabrication Technique ◽  
Beam Spot ◽  
Beam Spot Size ◽  
Current Voltage

We have fabricated nano-scaled planar superconductor-insulator-superconductor Josephson junctions using focused ion beam (FIB) with beam spot size ~5 nm . To study the effectiveness of this fabrication technique and for the purpose of comparisons, a variety of samples have been made based on high temperature superconducting (HTS) YBa2Cu3O7-δ electrodes. The insulators are either vacuum or silicon dioxide. The samples showed current-voltage (IV) characteristics typical of a resistively shunted junction (RSJ). We will discuss various aspects of the processing methods and the physical significance of the junction characteristics.

High-temperature superconducting bi-crystal Josephson junctions with asymmetric current biasing: the DC-SQUID configuration

2002 ◽  
Vol 372-376 ◽  
pp. 150-153 ◽  
Author(s):  
Peter B. Mozhaev ◽  
Igor V. Borisenko ◽  
Elena G. Ovsyannikova ◽  
Gennady A. Ovsyannikov
Keyword(s):  
High Temperature ◽  
Josephson Junctions ◽  
High Temperature Superconducting
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