Determination of frontier orbital alignment and band bending at an organic semiconductor heterointerface by combined x-ray and ultraviolet photoemission measurements
2013 ◽
Vol 14
(1)
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pp. 015007
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1978 ◽
Vol 36
(1)
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pp. 542-543
1990 ◽
Vol 48
(2)
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pp. 500-501
2003 ◽
Vol 107
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pp. 203-206
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