Electrical characterization of hole traps in p-type ZnSe and ZnSSe grown by molecular beam epitaxy
Keyword(s):
Keyword(s):
1991 ◽
pp. 669-674
2010 ◽
Vol 10
(14)
◽
pp. 1489-1491
◽
1999 ◽
Vol 17
(4)
◽
pp. 1307-1312
◽
Keyword(s):