Observation of chemical shifts of Si 2p level by an x-ray photoelectron spectroscopy system with a laser-plasma x-ray source

1998 ◽  
Vol 72 (21) ◽  
pp. 2668-2670 ◽  
Author(s):  
Hiroyuki Kondo ◽  
Toshihisa Tomie ◽  
Hideaki Shimizu
Keyword(s):  
Laser Plasma ◽  
Photoelectron Spectroscopy ◽  
Chemical Shifts ◽  
X Ray ◽  
Spectroscopy System

Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determination

2011 ◽  
Vol 43 (13) ◽  
pp. 1632-1635 ◽  
Author(s):  
Masaaki Kobata ◽  
Igor Píš ◽  
Hiroshi Nohira ◽  
Hideo Iwai ◽  
Keisuke Kobayashi
Keyword(s):  
Photoelectron Spectroscopy ◽  
X Ray ◽  
Thickness Determination ◽  
Spectroscopy System

scholarly journals XPS Investigations on Solid and Vacuum Deposited, Oxidized and Non-oxidized Palladium

1995 ◽  
Vol 50 (4-5) ◽  
pp. 381-387 ◽  
Author(s):  
Jürgen Kintrup ◽  
Harald Züchner
Keyword(s):  
Chemical Shift ◽  
Curve Fitting ◽  
Photoelectron Spectroscopy ◽  
Chemical Shifts ◽  
Atmospheric Oxygen ◽  
Hydrogen Permeability ◽  
Photoelectric Effect ◽  
High Accuracy ◽  
X Ray ◽  
Charging Effect

Abstract X-ray photoelectron spectroscopy (XPS) has been carried out to study the reaction of differently prepared palladium samples (solid and film Pd) with atmospheric oxygen. A careful curve fitting of the measured Pd-3d5/2 peak allows to separate the Pd-3d5/2 peak for Pd in surface PdO from the dominant Pd-3d5/2 peak of the non-oxidized bulk palladium and to determine the chemical shift of the "oxidized" Pa line with high accuracy. Differences in the chemical shifts for the surface PdO on solid and film palladium are explained by a different charging caused by the photoelectric effect in XPS measurements. The smaller charging effect observed for film palladium as compared to solid palladium indicates a stronger oxygen bonding to the (rougher) film palladium. The strong Pd-O bonding seems to be an essential reason for the reduced hydrogen-permeability of film palladium compared to solid palladium

Time of flight photoelectron spectroscopy with a laser‐plasma x‐ray source

1996 ◽  
Vol 69 (2) ◽  
pp. 182-184 ◽  
Author(s):  
Hiroyuki Kondo ◽  
Toshihisa Tomie ◽  
Hideaki Shimizu
Keyword(s):  
Laser Plasma ◽  
Photoelectron Spectroscopy ◽  
Time Of Flight ◽  
X Ray

scholarly journals Following excited-state chemical shifts in molecular ultrafast x-ray photoelectron spectroscopy

2022 ◽  
Vol 13 (1) ◽  
Author(s):  
D. Mayer ◽  
F. Lever ◽  
D. Picconi ◽  
J. Metje ◽  
S. Alisauskas ◽  
...  
Keyword(s):  
Excited State ◽  
Chemical Shift ◽  
Photoelectron Spectroscopy ◽  
Chemical Shifts ◽  
Excited Molecule ◽  
Charge Motion ◽  
Core Electron ◽  
Xps Spectra ◽  
X Ray ◽  
State Chemical

AbstractThe conversion of photon energy into other energetic forms in molecules is accompanied by charge moving on ultrafast timescales. We directly observe the charge motion at a specific site in an electronically excited molecule using time-resolved x-ray photoelectron spectroscopy (TR-XPS). We extend the concept of static chemical shift from conventional XPS by the excited-state chemical shift (ESCS), which is connected to the charge in the framework of a potential model. This allows us to invert TR-XPS spectra to the dynamic charge at a specific atom. We demonstrate the power of TR-XPS by using sulphur 2p-core-electron-emission probing to study the UV-excited dynamics of 2-thiouracil. The method allows us to discover that a major part of the population relaxes to the molecular ground state within 220–250 fs. In addition, a 250-fs oscillation, visible in the kinetic energy of the TR-XPS, reveals a coherent exchange of population among electronic states.

X-ray photoelectron spectroscopy with a laser plasma source

1997 ◽  
Author(s):  
Toshihisa Tomie ◽  
Hiroyuki Kondo ◽  
Hideaki Shimizu ◽  
Peixiang Lu
Keyword(s):  
Laser Plasma ◽  
Photoelectron Spectroscopy ◽  
Plasma Source ◽  
X Ray
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