The influence of the deformation on the two-dimensional electron gas density in GaN–AlGaN heterostructures

1998 ◽  
Vol 72 (1) ◽  
pp. 64-66 ◽  
Author(s):  
R. Gaska ◽  
J. W. Yang ◽  
A. D. Bykhovski ◽  
M. S. Shur ◽  
V. V. Kaminski ◽  
...  
2008 ◽  
Vol 103 (9) ◽  
pp. 093714 ◽  
Author(s):  
M. Gonschorek ◽  
J.-F. Carlin ◽  
E. Feltin ◽  
M. A. Py ◽  
N. Grandjean ◽  
...  

Author(s):  
Asmae Babaya ◽  
Bri Seddik ◽  
Saadi Adil

This paper is mainly dedicated to understand the phenomena governing the formation of two-dimensional electron gas (2DEG) confined in the quantum well which hold the role of the channel in the high electron density transistors (HEMT) based on AlGaN / GaN heterojunction. The theory takes into account: the crystal structure, the spontaneous and piezoelectric polarization concept, the formation mechanism of two-dimensional electron gas at the AlGaN / GaN interface, the approximate resolution of the Poisson and Schrödinger equations to determine the density of Two-dimensional electron gas after the analytical formula of the current-voltage characteristic is established. Our study is also concerned with the dependence of the two-dimensional electron gas density on the following technological parameters: Aluminum molare fraction, AlGaN layer thickness and AlGaN layer doping, In order to control the influence of these parameters on the device performance. Finally, the current-voltage characteristic which reflects the variation of the drain-source current as a function of the modulation of the gate voltage has been discussed.


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