Near-field scanning optical microscopy studies of Cu(In,Ga)Se2 solar cells

1997 ◽  
Vol 70 (26) ◽  
pp. 3555-3557 ◽  
Author(s):  
A. A. McDaniel ◽  
J. W. P. Hsu ◽  
A. M. Gabor
Keyword(s):  
Solar Cells ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Near-field scanning optical microscopy cross-sectional measurements of crystalline GaAs solar cells

2000 ◽  
Vol 77 (1) ◽  
pp. 100-102 ◽  
Author(s):  
M. K. Herndon ◽  
W. C. Bradford ◽  
R. T. Collins ◽  
B. E. Hawkins ◽  
T. F. Kuech ◽  
...  
Keyword(s):  
Solar Cells ◽  
Optical Microscopy ◽  
Near Field ◽  
Cross Sectional ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Origins of Contrast in Near-Field Scanning Optical Microscopy Photovoltage Images of Cu(In,Ga)Se2 Solar Cells

1997 ◽  
Vol 472 ◽  
Author(s):  
A. A. McDaniel ◽  
J. W. P. Hsu
Keyword(s):  
Solar Cells ◽  
Physical Properties ◽  
Grain Boundaries ◽  
Optical Microscopy ◽  
Near Field ◽  
Convincing Evidence ◽  
Two Factors ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

ABSTRACTPhotovoltage images of Cu(In,Ga)Se2 solar cells taken using near-field scanning optical microscopy (NSOM) show reduction of photoresponse along grain boundaries. Two factors might be responsible for this contrast. The first is that the topographic changes associated with the grains could cause the NSOM tip to move further from the sample, resulting in a reduction in photoresponse. The second possibility is that the contrast is due to real physical properties of the sample, e.g. higher recombination velocities near grain boundaries. We show convincing evidence that the major contribution to the contrast in the photovoltage images is due to the latter.

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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