Stability of a low‐temperature grown GaAs surface layer following air exposure using tunneling microscopy

1996 ◽  
Vol 68 (16) ◽  
pp. 2258-2260 ◽  
Author(s):  
S. Hong ◽  
R. Reifenberger ◽  
D. B. Janes ◽  
D. McInturff ◽  
J. M. Woodall
2003 ◽  
Vol 94 (5) ◽  
pp. 3651-3653 ◽  
Author(s):  
Kai Liu ◽  
Arunas Krotkus ◽  
K. Bertulis ◽  
Jingzhou Xu ◽  
X.-C. Zhang

1993 ◽  
Vol 22 (12) ◽  
pp. 1383-1386 ◽  
Author(s):  
K. Pond ◽  
J. Ibbetson ◽  
R. Maboudian ◽  
V. Bressler-Hill ◽  
W. H. Weinberg ◽  
...  

2011 ◽  
Vol 2011 ◽  
pp. 1-9 ◽  
Author(s):  
Yasuhiko Terada ◽  
Shoji Yoshida ◽  
Osamu Takeuchi ◽  
Hidemi Shigekawa

We investigated carrier recombination dynamics in a low-temperature-grown GaAs (LT-GaAs)/AlGaAs/GaAs heterostructure by laser-combined scanning tunneling microscopy, shaken-pulse-pair-excited STM (SPPX-STM). With the AlGaAs interlayer as a barrier against the flow of photocarriers, recombination lifetimes in LT-GaAs of 4.0 ps and GaAs of 4.8 ns were successfully observed separately. We directly demonstrated the high temporal resolution of SPPX-STM by showing the recombination lifetime of carriers in LT-GaAs (4.0 ps) in the range of subpicosecond temporal resolution. In the carrier-lifetime-mapping measurement, a blurring of recombination lifetime up to 50 nm was observed at the LT-GaAs/AlGaAs boundary, which was discussed in consideration of the screening length of the electric field from the STM probe. The effect of the built-in potential on the signal, caused by the existence of LT-GaAs/AlGaAs/GaAs boundaries, was discussed in detail.


2012 ◽  
Vol 9 (7) ◽  
pp. 1693-1695
Author(s):  
Juozas Adamonis ◽  
Klemensas Bertulis ◽  
Andrius Bičiūnas ◽  
Ramūnas Adomavičius ◽  
Arūnas Krotkus

2010 ◽  
Vol 405 (19) ◽  
pp. 4133-4138 ◽  
Author(s):  
D.W. Jung ◽  
J.P. Noh ◽  
N. Otsuka

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