Measurement of elastic impedance with high spatial resolution using acoustic microscopy

1995 ◽  
Vol 67 (6) ◽  
pp. 745-747 ◽  
Author(s):  
S. Hirsekorn ◽  
S. Pangraz ◽  
G. Weides ◽  
W. Arnold
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Acoustic Microscopy ◽  
Elastic Impedance

Acoustic Microscopy for Imaging and Characterization

MRS Bulletin ◽  
1996 ◽  
Vol 21 (10) ◽  
pp. 30-35 ◽  
Author(s):  
Andrew Briggs ◽  
Oleg Kolosov
Keyword(s):  
Nondestructive Testing ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Surface Coatings ◽  
Acoustic Microscopy ◽  
Minimum Size ◽  
Structure And Properties ◽  
Acoustic Microscope ◽  
Object A ◽  
Selection Of

Acoustic microscopy is useful for characterizing with high spatial resolution the elastic structure and properties of an object. A range of techniques is now available for doing this, which enables the user to select the method and instrument that is most appropriate for a particular requirement. For imaging the interior of structures such as electronic-component packaging, an acoustic microscope operating at a relatively modest frequency can provide advanced nondestructive testing. For characterizing surface coatings and layers that may be only a fraction of a micrometer thick, higher frequency quantitative techniques are needed. For a given application, three questions should be asked at the outset: (1) What depth of material do I wish to include in my inspection? (2) Do I wish to image structures and/or defects, or do I wish to characterize elastic properties? (3) What is the minimum size of a defect or inhomogeneity that I wish to resolve or characterize (at a given depth) during my inspection? Selection of the appropriate technique will depend on the answers.

High-spatial-resolution sub-surface imaging using a laser-based acoustic microscopy technique

2011 ◽  
Vol 58 (1) ◽  
pp. 226-233 ◽  
Author(s):  
Oluwaseyi Balogun ◽  
Garrett D. Cole ◽  
Robert Huber ◽  
Diane Chinn ◽  
Todd W. Murray ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Acoustic Microscopy ◽  
Surface Imaging ◽  
Microscopy Technique

High spatial resolution AEM observations of yttrium segregation in chromia scales grown on Co-45%Cr

1986 ◽  
Vol 44 ◽  
pp. 518-519
Author(s):  
K. Przybylski ◽  
A. J. Garratt-Reed ◽  
G. J. Yurek
Keyword(s):  
Spatial Resolution ◽  
Outer Surface ◽  
Maximum Concentration ◽  
High Spatial Resolution ◽  
Reactive Elements ◽  
Chromia Scales

The addition of so-called “reactive” elements such as yttrium to alloys is known to enhance the protective nature of Cr2O3 or Al2O3 scales. However, the mechanism by which this enhancement is achieved remains unclear. An A.E.M. study has been performed of scales grown at 1000°C for 25 hr. in pure O2 on Co-45%Cr implanted at 70 keV with 2x1016 atoms/cm2 of yttrium. In the unoxidized alloys it was calculated that the maximum concentration of Y was 13.9 wt% at a depth of about 17 nm. SIMS results showed that in the scale the yttrium remained near the outer surface.

Integration of Core-Edge Spectroscopy Methods for the Study of Polymers

1996 ◽  
Vol 54 ◽  
pp. 154-155
Author(s):  
E. G. Rightor
Keyword(s):  
Excited State ◽  
Polymer Blends ◽  
Gas Phase ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Electronic States ◽  
Core Electron ◽  
Bulk Solids ◽  
Development Application

Core edge spectroscopy methods are versatile tools for investigating a wide variety of materials. They can be used to probe the electronic states of materials in bulk solids, on surfaces, or in the gas phase. This family of methods involves promoting an inner shell (core) electron to an excited state and recording either the primary excitation or secondary decay of the excited state. The techniques are complimentary and have different strengths and limitations for studying challenging aspects of materials. The need to identify components in polymers or polymer blends at high spatial resolution has driven development, application, and integration of results from several of these methods.

Color Hologram Generation Using High Spatial Resolution Camera

2013 ◽  
Vol 67 (3) ◽  
pp. J108-J115
Author(s):  
Kosuke Nomura ◽  
Ryutaro Oi ◽  
Takanori Senoh ◽  
Taiichiro Kurita ◽  
Takayuki Hamamoto
Keyword(s):  
Spatial Resolution ◽  
High Spatial Resolution
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