Transient thermography using evanescent microwave microscope

1999 ◽  
Vol 70 (8) ◽  
pp. 3387-3390 ◽  
Author(s):  
M. Tabib-Azar ◽  
R. Ciocan ◽  
G. Ponchak ◽  
S. R. LeClair
Keyword(s):  
Microwave Microscope ◽  
Transient Thermography

scholarly journals Measurement of high frequency conductivity of oxide-doped anti-ferromagnetic thin film with a near-field scanning microwave microscope

AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  
Keyword(s):  
Thin Film ◽  
High Frequency ◽  
Near Field ◽  
Microwave Microscope ◽  
Near Field Scanning

A proof of concept of a non-resonant near-field microwave microscope based on a high impedance reflectometer

2013 ◽  
Vol 5 (3) ◽  
pp. 301-308
Author(s):  
David Glay ◽  
Adelhatif El Fellahi ◽  
Tuami Lasri
Keyword(s):  
Near Field ◽  
Metal Plate ◽  
Microwave Circuit ◽  
Proof Of Concept ◽  
Capacitance Measurements ◽  
High Impedance ◽  
Microwave Microscope ◽  
Lumped Elements

In this paper, we present a non-resonant high impedance reflectometer with a reference impedance close to one of the tip probe of a near-field microwave microscope. We show that for an apex of the tip probe of 100 µm there is an optimum reference impedance close to 1 kΩ. To validate this approach a microwave circuit that makes use of lumped elements has been fabricated. A proof of concept is also explored for capacitance measurements between the tip probe and a metal plate.

scholarly journals Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale

2014 ◽  
Vol 105 (13) ◽  
pp. 133112 ◽  
Author(s):  
A. O. Oladipo ◽  
A. Lucibello ◽  
M. Kasper ◽  
S. Lavdas ◽  
G. M. Sardi ◽  
...  
Keyword(s):  
Transmission Mode ◽  
Subsurface Imaging ◽  
Microwave Microscope
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