scholarly journals Analysis of a transmission mode scanning microwave microscope for subsurface imaging at the nanoscale

2014 ◽  
Vol 105 (13) ◽  
pp. 133112 ◽  
Author(s):  
A. O. Oladipo ◽  
A. Lucibello ◽  
M. Kasper ◽  
S. Lavdas ◽  
G. M. Sardi ◽  
...  
2015 ◽  
Vol 49 (4) ◽  
pp. 045502 ◽  
Author(s):  
Lin You ◽  
Jung-Joon Ahn ◽  
Yaw S Obeng ◽  
Joseph J Kopanski

Author(s):  
N. Osakabe ◽  
J. Endo ◽  
T. Matsuda ◽  
A. Tonomura

Progress in microscopy such as STM and TEM-TED has revealed surface structures in atomic dimension. REM has been used for the observation of surface dynamical process and surface morphology. Recently developed reflection electron holography, which employes REM optics to measure the phase shift of reflected electron, has been proved to be effective for the observation of surface morphology in high vertical resolution ≃ 0.01 Å.The key to the high sensitivity of the method is best shown by comparing the phase shift generation by surface topography with that in transmission mode. Difference in refractive index between vacuum and material Vo/2E≃10-4 owes the phase shift in transmission mode as shownn Fig. 1( a). While geometrical path difference is created in reflection mode( Fig. 1(b) ), which is measured interferometrically using high energy electron beam of wavelength ≃0.01 Å. Together with the phase amplification technique , the vertivcal resolution is expected to be ≤0.01 Å in an ideal case.


2016 ◽  
Vol 69 (1) ◽  
pp. 41-51
Author(s):  
Shigeo Okuma ◽  
Tadashi Nakatsuka
Keyword(s):  

2017 ◽  
Author(s):  
Madeline R. Hynek ◽  
◽  
Harry M. Jol ◽  
Jackelyn M. Seamans

2020 ◽  
Author(s):  
Harry M. Jol ◽  
◽  
Matthieu Giaime ◽  
Logan Bergevin ◽  
Yossi Salmon ◽  
...  
Keyword(s):  

2015 ◽  
Vol 23 (1) ◽  
Author(s):  
A. Bendada ◽  
S. Sfarra ◽  
C. Ibarra−Castanedo ◽  
M. Akhloufi ◽  
J.−P. Caumes ◽  
...  

AbstractInfrared (IR) reflectography has been used for many years for the detection of underdrawings on panel paintings. Advances in the fields of IR sensors and optics have impelled the wide spread use of IR reflectography by several recognized Art Museums and specialized laboratories around the World. The transparency or opacity of a painting is the result of a complex combination of the optical properties of the painting pigments and the underdrawing material, as well as the type of illumination source and the sensor characteristics. For this reason, recent researches have been directed towards the study of multispectral approaches that could provide simultaneous and complementary information of an artwork. The present work relies on non−simultaneous multispectral inspection using a set of detectors covering from the ultraviolet to the terahertz spectra. It is observed that underdrawings contrast increases with wavelength up to 1700 nm and, then, gradually decreases. In addition, it is shown that IR thermography, i.e., temperature maps or thermograms, could be used simultaneously as an alternative technique for the detection of underdrawings besides the detection of subsurface defects.


2020 ◽  
Vol 32 (6) ◽  
pp. 2733-2740
Author(s):  
Maan Al-Gain ◽  
Kamal Abdelrahman ◽  
Ali Kahal ◽  
Saleh Al-Zahrani ◽  
Elkhedr Ibrahim ◽  
...  

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