Microwave-frequency alternating current scanning tunneling microscopy by difference frequency detection: Atomic resolution imaging on graphite

1999 ◽  
Vol 70 (8) ◽  
pp. 3377-3380 ◽  
Author(s):  
J. Schmidt ◽  
D. H. Rapoport ◽  
H.-J. Fröhlich
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Microwave Frequency ◽  
Alternating Current ◽  
Difference Frequency ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Frequency Detection ◽  
Resolution Imaging

scholarly journals Atomic-Resolution Imaging of Close-Packed Metal Surfaces by Scanning Tunneling Microscopy

1989 ◽  
Vol 62 (1) ◽  
pp. 59-62 ◽  
Author(s):  
J. Wintterlin ◽  
J. Wiechers ◽  
H. Brune ◽  
T. Gritsch ◽  
H. Höfer ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Metal Surfaces ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Resolution Imaging

Quantitative Scanning Tunneling Microscopy at Atomic Resolution: Influence of Forces and Tip Configuration

1996 ◽  
Vol 76 (8) ◽  
pp. 1276-1279 ◽  
Author(s):  
A. R. H. Clarke ◽  
J. B. Pethica ◽  
J. A. Nieminen ◽  
F. Besenbacher ◽  
E. Lægsgaard ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Extending Atomic-resolution Electrochemicl Scanning Tunneling Microscopy Studies to Polycrystalline Electrode Surfaces

1997 ◽  
Vol 13 (12) ◽  
pp. 1061-1064
Author(s):  
Shi Cai-Hui ◽  
◽  
Cai Xiong-Wei ◽  
Chen Yan-Xia ◽  
Tian Zhong-Qun ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Atomic Resolution ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Electrode Surfaces

scholarly journals Can Dew Help us to Image Insulating Material?

1995 ◽  
Vol 3 (1) ◽  
pp. 18-21
Author(s):  
Stephen W. Carmichael
Keyword(s):  
High Resolution ◽  
Scanning Tunneling Microscopy ◽  
Electron Flow ◽  
Scanning Tunneling ◽  
High Resolution Imaging ◽  
Tunneling Microscopy ◽  
Insulating Material ◽  
Metal Atoms ◽  
New Development ◽  
Resolution Imaging

In high resolution imaging of biologic structure, atomic lorce microscopy (AFM) has been prevailing over scanning tunneling microscopy (STM). This is primarily because biologic materials do not conduct electricity, and STM requires that electrons flow to or from the surface of the specimen, whereas electron flow is not required for AFM. Microscopists intent on using STM have compensated by coating specimens with a thin coat of metal. However, the presence of metal atoms on the surface degrades the resolution. A new development may make STM more useful to biologists than ever before.

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