Description of a dust particle detection system and measurements of particulate contamination from shock, gate valve, and ion pump under ultrahigh vacuum conditions

1998 ◽  
Vol 69 (11) ◽  
pp. 3818-3827 ◽  
Author(s):  
J.-L. Dorier ◽  
N. Hilleret
Keyword(s):  
Dust Particle ◽  
Gate Valve ◽  
Detection System ◽  
Ultrahigh Vacuum ◽  
Ion Pump ◽  
Particle Detection ◽  
Particulate Contamination

Characterising the friction and wear behaviour of lubricated metal-metal pairings with an optical online particle detection system

2017 ◽  
Vol 30 (5) ◽  
pp. 207-228 ◽  
Author(s):  
Viktor Krasmik ◽  
Nils Röbken ◽  
Christoph Martin ◽  
Peter Martin ◽  
Josef Schlattmann
Keyword(s):  
Friction And Wear ◽  
Detection System ◽  
Wear Behaviour ◽  
Particle Detection ◽  
Metal Metal

A Stacked CMOS Active Pixel Image Sensor for Charge Particle Detection and the Application to SIMS

1999 ◽  
Vol 5 (S2) ◽  
pp. 370-371
Author(s):  
H. Yurimoto ◽  
K. Nagashima ◽  
T. Kunihiro ◽  
I. Takayanagi ◽  
J. Nakamura ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Detection System ◽  
Image Sensor ◽  
Two Dimensional ◽  
Particle Detection ◽  
Visible Image ◽  
Two Dimensional Image ◽  
Active Pixel ◽  
Channel Plate ◽  
Pixel Image

A stacked CMOS active pixel image-sensor (APS) has been developed for detecting various kinds of charged particles and its noise performance has been measured and analyzed. The sensitivity for ions and electrons with keV energy level utilizes for ion microscopy such-as SIMS and electron microscopy, respectively.Charge particles such as ions and electrons with kinetic energy of keV order are useful probes for surface analysis of material. A measurement system which yields two-dimensional image of charge particles is highly demanded. The conventional two-dimensional detection system is composed of a micro channel plate, a florescent plate which receives multiplied secondary electrons and generates a visible image, and a visible image sensor. However, its limited dynamic range and non-linearity in the ion-electron-to-photon conversion process make a quantitative measurement difficult. The proposed system using a stacked CMOS APS has several advantages over the conventional system such as high spatial resolution, no insensitive time, high S/N, wide dynamic range, nondestructive readout capability, high robustness, and low power consumption.

scholarly journals Thick-target inverse kinematic method in order to investigate alpha-clustering in212Po

2019 ◽  
Vol 223 ◽  
pp. 01049
Author(s):  
Maria Grazia Pellegriti ◽  
Agatino Musumarra ◽  
Enrico De Filippo ◽  
Marzio De Napoli ◽  
Alessia Di Pietro ◽  
...  
Keyword(s):  
Detection System ◽  
Inverse Kinematic ◽  
Thick Target ◽  
Gas Cell ◽  
Particle Detection ◽  
Gas Target ◽  
Superconducting Cyclotron ◽  
Kinematic Method ◽  
Reaction Channels ◽  
Alpha Clustering

The inverse-kinematic thick-target method has been used in order to investigate 212Po alpha-structure by the elastic scattering of 208Pb on 4He target. A 208Pb beam, accelerated by the Superconducting Cyclotron (CS) of Laboratori Nazionali del Sud - INFN, at the incident energy of 10.1 A MeV was impinging onto a specifically designed 4He gas cell, two meter long. The gas cell wasacting both as target and as beam degrader, stopping the beam before reaching the alpha-particle detection system placed at 0° with respect to the beam axis. In order to disentangle the elastic contribution from other reaction channels (e.g. inelastic scattering) a microchannel plate was used to measure the Time of Flight(ToF) of both the 208Pb beam particles and the ejectiles along the gas cell. The 208Pbstopping power in the 4He gas target was also measured, as a key ingredient in order to establish theinteraction point inside the gas cell, in turn determining the solid angle covered by the detector. In the following, the experimental technique will be described, and the results of a preliminary data analysis will be shown.

Evaluation of cleaning techniques for EUVL mask by using a highly sensitive particle detection system

2002 ◽  
Vol 61-62 ◽  
pp. 213-218 ◽  
Author(s):  
T Yoneda ◽  
H Hoko ◽  
E Hoshino ◽  
T Ogawa ◽  
S Okazaki ◽  
...  
Keyword(s):  
Detection System ◽  
Particle Detection ◽  
Highly Sensitive
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