In situ calibration of a flat-field grazing incidence spectrograph with an x-ray charge-coupled device camera using a transmission grating and a laser-produced plasma for x-ray laser research

1998 ◽  
Vol 69 (8) ◽  
pp. 2849-2853 ◽  
Author(s):  
C. Fujikawa ◽  
N. Yamaguchi ◽  
T. Hara ◽  
T. Kawachi ◽  
H. Oyama ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Charge Coupled Device ◽  
X Ray ◽  
Transmission Grating ◽  
In Situ Calibration ◽  
Flat Field ◽  
Laser Produced Plasma

Strain Relaxation and In-Situ Observation of Voiding in Passivated Aluminum Alloy Lines.

1993 ◽  
Vol 308 ◽  
Author(s):  
Paul R. Besser ◽  
Thomas N. Marieb ◽  
John C. Bravman
Keyword(s):  
Strain Relaxation ◽  
Grazing Incidence ◽  
Scanning Transmission Electron Microscope ◽  
In Situ Observation ◽  
X Ray ◽  
Scanning Transmission ◽  
Length Width ◽  
Measured Strain ◽  
Ray Geometry

ABSTRACTStrain relaxation in passivated Al-0.5% Cu lines was measured using X-ray diffraction coupled with in-situ observation of the formation and growth of stress induced voids. Samples of 1 μm thick Al-0.5% Cu lines passivated with Si3N4 were heated to 380ºC, then cooled and held at 150ºC. During the test, principal strains along the length, width, and height of the line were determined using a grazing incidence x-ray geometry. From these measurements the hydrostatic strain in the metal was calculated and strain relaxation was observed. The thermal cycle was duplicated in a high voltage scanning transmission electron microscope equipped with a backscattered electron detector. The 1.25 μm wide lines were seen to have initial stress voids. Upon heating these voids reduced in size until no longer observable. Once the samples were cooled to 150ºC, voids reappeared and grew. The measured strain relaxation is discussed in terms of void and θ-phase (Al2Cu) formation.

scholarly journals X-ray transmission grating spectrometer with CCD detector for laser plasma studies

1991 ◽  
Vol 9 (2) ◽  
pp. 579-591 ◽  
Author(s):  
L. Pína ◽  
H. Fiedorowicz ◽  
M. O. Koshevoi ◽  
A. A. Rupasov ◽  
B. Rus ◽  
...  
Keyword(s):  
Laser Plasma ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Array Detector ◽  
Charge Coupled Device ◽  
X Ray ◽  
Transmission Grating ◽  
Hot Plasma ◽  
Ccd Detector ◽  
Wet Processing

A program is under way to develop methods and instrumentation based on charge-coupled device (CCD) sensors for hot plasma diagnostics. We have developed a new X-ray spectrometer in which a freestanding X-ray transmission grating is coupled to a CCD linear array detector with electronic digitized readout replacing film and its wet processing. This instrument measures time-integrated pulsed X-ray spectra with moderate spectral resolution (δλ ≤ 0.6 nm) over a broad spectral range (0.3–2 keV) with high sensitivity, linearity, and large dynamic range. The performance of the device was tested using laser plasma as the X-ray source.

scholarly journals In Situ Investigation of the Early-Stage Growth of Nanoporous Alumina

2018 ◽  
Vol 2018 ◽  
pp. 1-9
Author(s):  
Thérèse Gorisse ◽  
Ludovic Dupré ◽  
Marc Zelsmann ◽  
Alina Vlad ◽  
Alessandro Coati ◽  
...  
Keyword(s):  
Early Stage ◽  
Grazing Incidence ◽  
Alumina Layer ◽  
Nanoporous Alumina ◽  
X Ray ◽  
X Ray Scattering ◽  
In Situ Investigation ◽  
Low X ◽  
X Ray Absorption

We report the successful use of in situ grazing incidence small-angle X-ray scattering to follow the anodization of aluminum. A dedicated electrochemical cell was designed and developed for this purpose with low X-ray absorption, with the possibility to access all azimuthal angles (360°) and to remotely control the temperature of the electrolyte. Three well-known fabrication techniques of nanoporous alumina, i.e., single, double, and pretextured, were investigated. The differences in the evolution of the scattering images are described and explained. From these measurements, we could determine at which moment the pores start growing even for very short anodization times. Furthermore, we could follow the thickness of the alumina layer as a function of the anodization time by monitoring the period of the Kiessig fringes. This work is aimed at helping to understand the different steps taking place during the anodization of aluminum at the very early stages of nanoporous alumina formation.

Structure of in-situ grown GaAs(001) reconstructed surfaces by grazing incidence X-ray diffraction

1989 ◽  
Vol 211-212 ◽  
pp. 39-47 ◽  
Author(s):  
M. Sauvage-Simkin ◽  
R. Pinchaux ◽  
J. Massies ◽  
P. Claverie ◽  
J. Bonnet ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Reconstructed Surfaces

In situ calibrations of grazing incidence vacuum monochromators for x‐ray laser research

1986 ◽  
Vol 57 (12) ◽  
pp. 3027-3030 ◽  
Author(s):  
H. Milchberg ◽  
C. H. Skinner ◽  
S. Suckewer ◽  
D. Voorhees
Keyword(s):  
Grazing Incidence ◽  
X Ray

Ultrahigh‐vacuum four‐circle diffractometer for grazing incidence x‐ray diffraction on in situ MBE grown III‐V semiconductor surfaces

1989 ◽  
Vol 60 (7) ◽  
pp. 2369-2372 ◽  
Author(s):  
P. Claverie ◽  
J. Massies ◽  
R. Pinchaux ◽  
M. Sauvage‐Simkin ◽  
J. Frouin ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
Grazing Incidence ◽  
Semiconductor Surfaces ◽  
X Ray Diffraction ◽  
X Ray
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