Bolt-on source of spin-polarized electrons for inverse photoemission

1998 ◽  
Vol 69 (6) ◽  
pp. 2297-2304 ◽  
Author(s):  
Fredrik Schedin ◽  
Ranald Warburton ◽  
Geoff Thornton
2002 ◽  
Vol 09 (01) ◽  
pp. 487-489
Author(s):  
S. QIAO ◽  
A. KIMURA ◽  
A. MORIHARA ◽  
S. HASUI ◽  
E. KOTANI ◽  
...  

For a spin-resolved inverse photoemission spectrometer, the most important component is the electron optics system consisting of a 90° deflector and lenses to transfer the spin-polarized electrons from a GaAs photocathode to the sample at high transmission. We adopt a cylindrical deflector when we construct a spin-resolved inverse photoemission spectrometer. A performance test shows that our electronic optics system has achieved 83% transmission, and also that the cylindrical deflector has no shortcoming compared to the spherical type.


1988 ◽  
Vol 49 (C8) ◽  
pp. C8-9-C8-16 ◽  
Author(s):  
H. C. Siegmann ◽  
D. Mauri ◽  
D. Scholl ◽  
E. Kay

1975 ◽  
Vol 34 (11) ◽  
pp. 710-710 ◽  
Author(s):  
U. Heinzmann ◽  
H. Heuer ◽  
J. Kessler

2005 ◽  
Vol 72 (23) ◽  
Author(s):  
J. Carlos Egues ◽  
Guido Burkard ◽  
D. S. Saraga ◽  
John Schliemann ◽  
Daniel Loss

1990 ◽  
Vol 80 (1) ◽  
pp. 5-6 ◽  
Author(s):  
R. Wiesendanger ◽  
H. J. G�ntherodt ◽  
G. G�ntherodt ◽  
R. J. Gambino ◽  
R. Ruf

1993 ◽  
Vol 313 ◽  
Author(s):  
N. J. Zheng ◽  
C. Rau

ABSTRACTWe have developed a novel, high-resolution magnetic imaging technique, scanning-ion microscopy with polarization analysis (SIMPA). In SIMPA, a highly-focused, scanning Ga+ ion beam is used to excite spin-polarized electrons at surfaces of ferromagnetic Materials. By Measuring the intensity and the spin polarization of the emitted electrons using a newly developed, compact mott polarimeter, topographic and magnetic images of magnetic structures are obtained. We report on first SIMPA studies on single-crystalline Fe samples.


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