Angle‐resolved inverse photoemission spectroscopy with longitudinally spin‐polarized electrons

1990 ◽  
Vol 61 (10) ◽  
pp. 2528-2533 ◽  
Author(s):  
W. Grentz ◽  
M. Tschudy ◽  
B. Reihl ◽  
G. Kaindl
2002 ◽  
Vol 09 (01) ◽  
pp. 487-489
Author(s):  
S. QIAO ◽  
A. KIMURA ◽  
A. MORIHARA ◽  
S. HASUI ◽  
E. KOTANI ◽  
...  

For a spin-resolved inverse photoemission spectrometer, the most important component is the electron optics system consisting of a 90° deflector and lenses to transfer the spin-polarized electrons from a GaAs photocathode to the sample at high transmission. We adopt a cylindrical deflector when we construct a spin-resolved inverse photoemission spectrometer. A performance test shows that our electronic optics system has achieved 83% transmission, and also that the cylindrical deflector has no shortcoming compared to the spherical type.


1993 ◽  
Vol 47 (23) ◽  
pp. 15848-15851 ◽  
Author(s):  
Lamberto Duò ◽  
Marco Finazzi ◽  
Franco Ciccacci ◽  
Lucio Braicovich

1990 ◽  
Vol 42 (3) ◽  
pp. 1829-1832 ◽  
Author(s):  
C. Chemelli ◽  
S. Luridiana ◽  
M. Sancrotti ◽  
L. Braicovich ◽  
F. Ciccacci ◽  
...  

2007 ◽  
Vol 1012 ◽  
Author(s):  
Shimpei Teshima ◽  
Hirotake Kashiwabara ◽  
Keimei Masamoto ◽  
Kazuya Kikunaga ◽  
Kazunori Takeshita ◽  
...  

AbstractDependence of band alignments at interfaces between CdS by chemical bath deposition and Cu(In1-xGax)Se2 by conventional 3-stage co-evaporation on Ga substitution ratio x from 0.2 to 1.0 has been systematically studied by means of photoemission spectroscopy (PES) and inverse photoemission spectroscopy (IPES). For the specimens of the In-rich CIGS, conduction band minimum (CBM) by CIGS was lower than that of CdS. Conduction band offset of them was positive about +0.3 ~ +0.4 eV. Almost flat conduction band alignment was realized at x = 0.4 ~ 0.5. On the other hand, at the interfaces over the Ga-rich CIGS, CBM of CIGS was higher than that of CdS, and CBO became negative. The present study reveals that the decrease of CBO with a rise of x presents over the wide rage of x, which results in the sign change of CBO around 0.4 ~ 0.45. In the Ga-rich interfaces, the minimum of band gap energy, which corresponded to energy spacing between CBM of CdS and valence band maximum of CIGS, was almost identical against the change of band gap energy of CIGS. Additionally, local accumulation of oxygen related impurities was observed at the Ga-rich samples, which might cause the local rise of band edges in central region of the interface.


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