A novel thick-layer electrochemical cell for in situ x-ray diffraction

1998 ◽  
Vol 69 (2) ◽  
pp. 512-516 ◽  
Author(s):  
G. Scherb ◽  
A. Kazimirov ◽  
J. Zegenhagen
Keyword(s):  
Electrochemical Cell ◽  
Thick Layer ◽  
X Ray Diffraction ◽  
X Ray

Time response of the thin layer electrochemical cell used for in situ X-ray diffraction

2002 ◽  
Vol 47 (19) ◽  
pp. 3057-3064 ◽  
Author(s):  
J.E. DeVilbiss ◽  
J.X. Wang ◽  
B.M. Ocko ◽  
K. Tamura ◽  
R.R. Adzic ◽  
...  
Keyword(s):  
Thin Layer ◽  
Electrochemical Cell ◽  
Time Response ◽  
X Ray Diffraction ◽  
X Ray

Electrochemical cell for in situ x-ray diffraction under ultrapure conditions

1998 ◽  
Vol 69 (4) ◽  
pp. 1840-1843 ◽  
Author(s):  
Th. Koop ◽  
W. Schindler ◽  
A. Kazimirov ◽  
G. Scherb ◽  
J. Zegenhagen ◽  
...  
Keyword(s):  
Electrochemical Cell ◽  
X Ray Diffraction ◽  
X Ray

Charge-influenced structural properties of electrically connected platinum nanoparticles

2001 ◽  
Vol 676 ◽  
Author(s):  
R. N. Viswanath ◽  
J. Weissmüller ◽  
R. Würschum ◽  
H. Gleiter
Keyword(s):  
Platinum Nanoparticles ◽  
Surface Stress ◽  
Nanocrystalline Materials ◽  
Electrochemical Cell ◽  
Volumetric Strain ◽  
Volume Ratio ◽  
Applied Potential ◽  
X Ray Diffraction ◽  
X Ray

ABSTRACTWe present results of a study motivated by the recent suggestion that the properties of nanocrystalline materials with a large surface-to-volume ratio can be tuned by inducing spacecharge regions at interfaces by means of an applied voltage. As an example, we investigate the reversible variation of the lattice constant of platinum nanoparticles immersed in an aqueous 1M KOH electrolyte as a function of applied potential. It is found that a reversible volumetric strain of up to 1.2 % can be induced, corresponding to pressures of up to 3.2 GPa. We present the experimental set-ups for in-situ X-ray diffraction with an electrochemical cell. The variation of the space charge at the metal-electrolyte interface results in a variation of the surface stress f as a function of the applied potential, which is not an electrocapillary effect.

In situ X-ray diffraction experiments on lithium intercalation compounds

1982 ◽  
Vol 60 (3) ◽  
pp. 307-313 ◽  
Author(s):  
J. R. Dahn ◽  
M. A. Py ◽  
R. R. Haering
Keyword(s):  
Electrochemical Cell ◽  
Lithium Concentration ◽  
Host Lattice ◽  
Intercalation Compounds ◽  
Lithium Intercalation ◽  
X Ray Diffraction ◽  
Detailed Design ◽  
X Ray

We describe powder X-ray diffraction experiments on lithium intercalation compounds. Using a unique electrochemical cell which incorporates a beryllium X-ray window we are able to monitor changes in the host lattice which occur when the lithium concentration is altered electrochemically. The detailed design of the cells and experimental problems which arise when using the in situ X-ray diffraction technique are discussed. Results of experiments on LixTiS2 are reported for 0 ≤ x ≤ 2.

Portable Apparatus for In Situ X-Ray Diffraction and Fluorescence Analyses of Artworks

2011 ◽  
Vol 17 (5) ◽  
pp. 667-673 ◽  
Author(s):  
Myriam Eveno ◽  
Brice Moignard ◽  
Jacques Castaing
Keyword(s):  
Thick Layer ◽  
Xrd Analysis ◽  
X Rays ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
Polycapillary Optics ◽  
X Ray ◽  
Analytical Technique ◽  
Lead Compounds

AbstractA portable X-ray fluorescence/X-ray diffraction (XRF/XRD) system for artwork studies has been designed constructed and tested. It is based on Debye Scherrer XRD in reflection that takes advantage of many recent improvements in the handling of X-rays (polycapillary optics; advanced two-dimensional detection). The apparatus is based on a copper anode air cooled X-ray source, and the XRD analysis is performed on a 5–20 μm thick layer from the object surface. Energy dispersive XRF elemental analysis can be performed at the same point as XRD, giving elemental compositions that support the interpretation of XRD diagrams. XRF and XRD analyses were tested to explore the quality and the limits of the analytical technique. The XRD diagrams are comparable in quality with diagrams obtained with conventional laboratory equipment. The mineral identification of materials in artwork is routinely performed with the portable XRF-XRD system. Examples are given for ceramic glazes containing crystals and for paintings where the determination of pigments is still a challenge for nondestructive analysis. For instance, lead compounds that provide a variety of color pigments can be easily identified as well as a pigment such as lapis lazuli that is difficult to identify by XRF alone. More than 70 works of art have been studied in situ in museums, monuments, etc. In addition to ceramics and paintings, these works include bronzes, manuscripts, etc., which permit improvement in the comprehension of ancient artistic techniques.

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

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