A transmission geometry electrochemical cell for in situ x‐ray diffraction

1993 ◽  
Vol 64 (4) ◽  
pp. 1061-1065 ◽  
Author(s):  
K. M. Robinson ◽  
W. E. O’Grady
Keyword(s):  
Electrochemical Cell ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Geometry

A novel thick-layer electrochemical cell for in situ x-ray diffraction

1998 ◽  
Vol 69 (2) ◽  
pp. 512-516 ◽  
Author(s):  
G. Scherb ◽  
A. Kazimirov ◽  
J. Zegenhagen
Keyword(s):  
Electrochemical Cell ◽  
Thick Layer ◽  
X Ray Diffraction ◽  
X Ray

Time response of the thin layer electrochemical cell used for in situ X-ray diffraction

2002 ◽  
Vol 47 (19) ◽  
pp. 3057-3064 ◽  
Author(s):  
J.E. DeVilbiss ◽  
J.X. Wang ◽  
B.M. Ocko ◽  
K. Tamura ◽  
R.R. Adzic ◽  
...  
Keyword(s):  
Thin Layer ◽  
Electrochemical Cell ◽  
Time Response ◽  
X Ray Diffraction ◽  
X Ray

Electrochemical cell for in situ x-ray diffraction under ultrapure conditions

1998 ◽  
Vol 69 (4) ◽  
pp. 1840-1843 ◽  
Author(s):  
Th. Koop ◽  
W. Schindler ◽  
A. Kazimirov ◽  
G. Scherb ◽  
J. Zegenhagen ◽  
...  
Keyword(s):  
Electrochemical Cell ◽  
X Ray Diffraction ◽  
X Ray

A 1000°C furnace forin situX-ray diffraction

2001 ◽  
Vol 34 (5) ◽  
pp. 677-678 ◽  
Author(s):  
Anna Puig-Molina ◽  
Bernard Gorges ◽  
Heinz Graafsma
Keyword(s):  
Solid State ◽  
Detector System ◽  
Solid State Reactions ◽  
Controlled Atmosphere ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Geometry ◽  
Melting And Crystallization

A furnace covering the temperature range from 25 to 1000°C has been designed and constructed to studyin situsolid-state reactions and melting and crystallization processes, with X-ray diffraction in transmission geometry using a two-dimensional-detector system. The oven can work in low vacuum and under a controlled atmosphere.

Charge-influenced structural properties of electrically connected platinum nanoparticles

2001 ◽  
Vol 676 ◽  
Author(s):  
R. N. Viswanath ◽  
J. Weissmüller ◽  
R. Würschum ◽  
H. Gleiter
Keyword(s):  
Platinum Nanoparticles ◽  
Surface Stress ◽  
Nanocrystalline Materials ◽  
Electrochemical Cell ◽  
Volumetric Strain ◽  
Volume Ratio ◽  
Applied Potential ◽  
X Ray Diffraction ◽  
X Ray

ABSTRACTWe present results of a study motivated by the recent suggestion that the properties of nanocrystalline materials with a large surface-to-volume ratio can be tuned by inducing spacecharge regions at interfaces by means of an applied voltage. As an example, we investigate the reversible variation of the lattice constant of platinum nanoparticles immersed in an aqueous 1M KOH electrolyte as a function of applied potential. It is found that a reversible volumetric strain of up to 1.2 % can be induced, corresponding to pressures of up to 3.2 GPa. We present the experimental set-ups for in-situ X-ray diffraction with an electrochemical cell. The variation of the space charge at the metal-electrolyte interface results in a variation of the surface stress f as a function of the applied potential, which is not an electrocapillary effect.

scholarly journals Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Geandier Guillaume ◽  
Renault Pierre-Olivier ◽  
Goudeau Philippe ◽  
Eric Le Bourhis ◽  
Girault Baptiste
Keyword(s):  
Thin Films ◽  
Mechanical Response ◽  
Tensile Tests ◽  
Elastic Behavior ◽  
Metallic Thin Films ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
Transmission Geometry

AbstractUnderstanding the mechanical behaviour of nano-structured thin films in relation to their structure, in particular to the grain size, is of high importance for the development of technological applications. Model nanometric multilayer W/Au systems exhibiting different structures are elaborated. These films are supported by a (thin) polyimide substrate. Films mechanical response is characterized experimentally by tensile tests carried out in-situ in a X-ray diffractometer installed on a synchrotron source. X-ray diffraction in transmission geometry has been used to study the deformations of both phases as a function of applied load. This geometry has been developed in the aim of optimizing the experiment time.

In situ X-ray diffraction experiments on lithium intercalation compounds

1982 ◽  
Vol 60 (3) ◽  
pp. 307-313 ◽  
Author(s):  
J. R. Dahn ◽  
M. A. Py ◽  
R. R. Haering
Keyword(s):  
Electrochemical Cell ◽  
Lithium Concentration ◽  
Host Lattice ◽  
Intercalation Compounds ◽  
Lithium Intercalation ◽  
X Ray Diffraction ◽  
Detailed Design ◽  
X Ray

We describe powder X-ray diffraction experiments on lithium intercalation compounds. Using a unique electrochemical cell which incorporates a beryllium X-ray window we are able to monitor changes in the host lattice which occur when the lithium concentration is altered electrochemically. The detailed design of the cells and experimental problems which arise when using the in situ X-ray diffraction technique are discussed. Results of experiments on LixTiS2 are reported for 0 ≤ x ≤ 2.

Texture Analysis of Coated Conductors by Micro-Raman and Synchrotron x-ray Diffraction

2000 ◽  
Vol 659 ◽  
Author(s):  
Teresa Puig ◽  
Anna Puig-Molina ◽  
Narcís Mestres ◽  
Harm Van Seijen ◽  
Francesc Alsina ◽  
...  
Keyword(s):  
Texture Analysis ◽  
Coated Conductors ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
Superconducting Layer ◽  
X Ray ◽  
Transmission Geometry ◽  
Non Destructive ◽  
Ybco Coated Conductors

ABSTRACTTwo novel complementary and non-destructive techniques for texture analysis of YBCO coated conductors are presented. Micro-Raman (μ-Raman) spectroscopy enables an easy analysis of the film homogeneity by determining the distribution of a- and c-oriented grains within the tape with a 1 μm spatial resolution and acquisition times of 5 min/spot. In addition, synchrotron x-ray diffraction analysis in transmission geometry and 2D detectors enables, with acquisition times of 100 ms, simultaneous observation of a- and c- crystallites and in-plane textures of substrates, buffers and superconducting layer. Thus, opening the field of this technique to in-situ analysis of epitaxial growth of coated conductors prepared by ex-situ processes. Results from these two techniques for stainless steel tapes buffered with IBAD-YSZ and coated with PLD-YBCO are analyzed.

Sign in / Sign up

Export Citation Format

Share Document