Ion energy loss spectroscopic apparatus using cylindrical electrostatic energy analyzer equipped with the Matsuda plate

1997 ◽  
Vol 68 (8) ◽  
pp. 3042-3045 ◽  
Author(s):  
Kenichi Iwamoto ◽  
Akira Matsumoto
Author(s):  
J.D. Edmonds ◽  
J. Silcox

A unipotential electrostatic energy analyzer and filter lens has been developed for the Hitachi HU-11A electron microscope which can simultaneously analyze the selected area energy loss spectra of the transmitted and diffracted beams with a resolution of about 0.5 eV (see Fig. 1). The electron image or diffraction pattern can also be filtered of those inelastically scattered electrons which lose more than a few eV, but further work is needed to reduce the aberrations in the image. The analyzer consists of a high voltage electrode inserted between grounded electrodes in the diffraction chamber of the Hitachi HU-11A (see Fig. 2). Earlier work by Shaffer, Silcox and Siegel at 50 keV demonstrated that such an analyzer placed between the intermediate and projector lenses of an experimental microscope was capable of about 1 eV resolution. The electrode geometry is patterned after the filter lens work of Hahn. The effects on the image of changing the lens parameters, altering the alignment of the central electrode and varying the electron beam over a few hundred volts, have been investigated experimentally.


Author(s):  
T. Oikawa ◽  
M. Inoue ◽  
T. Honda ◽  
Y. Kokubo

EELS allows us to make analysis of light elements such as hydrogen to heavy elements of microareas on the specimen. In energy loss spectra, however, elemental signals ride on a high background; therefore, the signal/background (S/B) ratio is very low in EELS. A technique which collects the center beam axial-symmetrically in the scattering angle is generally used to obtain high total intensity. However, the technique collects high background intensity together with elemental signals; therefore, the technique does not improve the S/B ratio. This report presents the experimental results of the S/B ratio measured as a function of the scattering angle and shows the possibility of the S/B ratio being improved in the high scattering angle range.Energy loss spectra have been measured using a JEM-200CX TEM with an energy analyzer ASEA3 at 200 kV.Fig.l shows a typical K-shell electron excitation edge riding on background in an energy loss spectrum.


1982 ◽  
Vol 53 (7) ◽  
pp. 1027-1031 ◽  
Author(s):  
R. L. Stenzel ◽  
R. Williams ◽  
R. Agüero ◽  
K. Kitazaki ◽  
A. Ling ◽  
...  
Keyword(s):  

1981 ◽  
Vol 23 (3) ◽  
pp. 957-966 ◽  
Author(s):  
J. A. Golovchenko ◽  
A. N. Goland ◽  
J. S. Rosner ◽  
C. E. Thorn ◽  
H. E. Wegner ◽  
...  

2012 ◽  
Author(s):  
E D Fredrickson ◽  
D S Darrow ◽  
N N Gorelenkov ◽  
G J Kramer ◽  
S Kubota ◽  
...  

1996 ◽  
Vol 67 (6) ◽  
pp. 2415-2416
Author(s):  
Mamoru Sakaki ◽  
Tateki Sakakibara

1981 ◽  
Vol 28 (2) ◽  
pp. 1227-1229 ◽  
Author(s):  
J. M. Anthony ◽  
P. D. Parker ◽  
W. A. Lanford
Keyword(s):  

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