Guidance characteristics of some displacement devices used in a high-precision He–Ne laser displacement measurement system

1997 ◽  
Vol 68 (7) ◽  
pp. 2913-2914
Author(s):  
U. Brand ◽  
K. Miyashita ◽  
J. Hannemann
Keyword(s):  
High Precision ◽  
Measurement System ◽  
Displacement Measurement

A high-precision laser displacement measurement system

2021 ◽  
Author(s):  
Wenqing Pan ◽  
Dengwei Zhang ◽  
Cui Liang ◽  
Chao Ma ◽  
Xiaowu Shu ◽  
...  
Keyword(s):  
High Precision ◽  
Measurement System ◽  
Displacement Measurement

A Novel Optical Fiber Displacement Measurement System

2014 ◽  
Vol 599-601 ◽  
pp. 684-688 ◽  
Author(s):  
Kai Sen Guan ◽  
Yu He Li ◽  
Yan Xiang Chen ◽  
Yong Rong Qiu
Keyword(s):  
Optical Fiber ◽  
High Precision ◽  
Measurement System ◽  
Simple Structure ◽  
Large Range ◽  
Measurement Model ◽  
Displacement Measurement ◽  
Displacement System ◽  
Novel Design ◽  
Structure Light

In order to meet the displacement measurement’s need for high precision and large measuring range, a novel design of optical fiber displacement system is proposed. Optical fiber is applied to the displacement measurement field with its simple structure, light weight, cheap cost and high precision. A displacement measurement model based on transmissive optical fiber is established, and theoretical calculation and simulation are conducted to verify the accuracy of the model. Displacement measuring experiments are completed and the results show that the transmissive optical fiber displacement measurement system has high measuring accuracy with the relative error less than 0.2% over a large range.

Hardware-in-the-Loop Simulation of High Precision Displacement Measurement System

2019 ◽  
Vol 46 (2) ◽  
pp. 0204001
Author(s):  
张文涛 Zhang Wentao ◽  
杜浩 Du Hao ◽  
熊显名 Xiong Xianming ◽  
谢仁飚 Xie Renbiao ◽  
王献英 Wang Xianying
Keyword(s):  
High Precision ◽  
Measurement System ◽  
Displacement Measurement ◽  
Hardware In The Loop

scholarly journals CPLD-Based Displacement Measurement System for Nanoscale Grating Ruler

2020 ◽  
Vol 2020 ◽  
pp. 1-8
Author(s):  
Jiyuan Sun ◽  
Chunlin Tian
Keyword(s):  
High Precision ◽  
Measurement System ◽  
Measurement Accuracy ◽  
Displacement Measurement ◽  
Measurement Technology ◽  
Precision Manufacturing ◽  
High Precision Measurement ◽  
Measurement Control ◽  
High Measurement ◽  
The Times

With the continuous development of science and technology, industrial production has higher and higher requirements for precision. Many high-precision measurement technologies emerge as the times require, and nanoscale grating ruler displacement measurement technology is one of them. As a kind of precision sensor, nanoscale grating ruler has important application in displacement measurement system. CPLD has the advantages of high integration and fast programming speed, which is often used to control the displacement measurement system of nanoscale grating ruler. The purpose of this paper is to deeply explore the measurement effect and related application principle of nanoscale grating ruler displacement measurement system based on CPLD technology. A set of nanoscale grating ruler displacement measurement system is designed based on CPLD technology. The output signal of grating ruler is programmed by CPLD. The x-axis displacement of the experimental platform controlled by stepping motor is measured, and the measured data are recorded by carrying out analysis and research. The results show that compared with the traditional phase difference measurement system, the measurement accuracy of the system based on CPLD is improved by 24.7%, the robustness of the measurement system is improved by 18.6%, and the measurement speed is increased by 27.3%. Therefore, this kind of nanoscale measurement precision grating ruler displacement measurement control system based on CPLD has three characteristics: high measurement accuracy, strong anti-interference ability, and high measurement motion efficiency, which can effectively meet the requirements of grating ruler displacement measurement system for high-precision manufacturing technology.

A Linear Least Square with Duffing Chaotic Detection Designed in Micro-Distance Movement Measurement System

2016 ◽  
Vol 20 (2) ◽  
pp. 287-293
Author(s):  
Xiao Lin ◽  
◽  
Yaping Dai ◽  
Linhui Zhao ◽  
Keyword(s):  
High Precision ◽  
Relative Error ◽  
Measurement System ◽  
Displacement Measurement ◽  
Least Square ◽  
Strain Gauges ◽  
Measurement Framework ◽  
Simulation Results ◽  
Lock In ◽  
Linear Least Square

High precision micro displacement measurement framework is fundamental for drilling strain gauges. We replaced the traditional lock-in amplifier method by the linear least square (LLS) based on Duffing chaotic detection (DCD) in drilling strain gauges. Simulation results showed that LLS based on DCD has a relative error 7.7% when SNR = −20.79 dB. It is 410.1% lower than lock-in amplifier method in the detection. Even more, the design and realization of LLS based on DCD is easier than lock-in amplifier method.

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