High flux and high resolution beamline for elliptically polarized radiation in the vacuum ultraviolet and soft x‐ray regions

1995 ◽  
Vol 66 (2) ◽  
pp. 1718-1720 ◽  
Author(s):  
A. Derossi ◽  
F. Lama ◽  
M. Piacentini ◽  
T. Prosperi ◽  
N. Zema
Keyword(s):  
High Resolution ◽  
Vacuum Ultraviolet ◽  
High Flux ◽  
X Ray ◽  
Elliptically Polarized ◽  
Polarized Radiation

Performance of the vacuum ultraviolet high-resolution and high-flux beamline for chemical dynamics studies at the Advanced Light Source

1997 ◽  
Vol 68 (5) ◽  
pp. 1945-1951 ◽  
Author(s):  
P. A. Heimann ◽  
M. Koike ◽  
C. W. Hsu ◽  
D. Blank ◽  
X. M. Yang ◽  
...  
Keyword(s):  
High Resolution ◽  
Light Source ◽  
Vacuum Ultraviolet ◽  
High Flux ◽  
Chemical Dynamics ◽  
Advanced Light Source

KMC-1: A high resolution and high flux soft x-ray beamline at BESSY

2007 ◽  
Vol 78 (12) ◽  
pp. 123102 ◽  
Author(s):  
F. Schaefers ◽  
M. Mertin ◽  
M. Gorgoi
Keyword(s):  
High Resolution ◽  
High Flux ◽  
X Ray

Vacuum ultraviolet high‐resolution and high‐flux beamline for the Aladdin storage ring

1995 ◽  
Vol 66 (2) ◽  
pp. 2194-2196 ◽  
Author(s):  
R. Reininger ◽  
M. C. Severson ◽  
R. W. C. Hansen ◽  
W. R. Winter ◽  
M. A. Green ◽  
...  
Keyword(s):  
High Resolution ◽  
Storage Ring ◽  
Vacuum Ultraviolet ◽  
High Flux

An FPGA-based algorithm to correct the instability of high-resolution and high-flux X-ray spectroscopic imaging detectors

2018 ◽  
Vol 13 (08) ◽  
pp. P08022-P08022
Author(s):  
C. de Cesare ◽  
A. Brambilla ◽  
P. Ouvrier-Buffet ◽  
S. Stanchina ◽  
O. Rossetto ◽  
...  
Keyword(s):  
High Resolution ◽  
Spectroscopic Imaging ◽  
High Flux ◽  
X Ray ◽  
Imaging Detectors

A SOFT X-RAY UNDULATOR BEAMLINE AT THE ADVANCED LIGHT SOURCE WITH CIRCULAR AND VARIABLE LINEAR POLARIZATION FOR THE SPECTROSCOPY AND MICROSCOPY OF MAGNETIC MATERIALS

2002 ◽  
Vol 09 (01) ◽  
pp. 549-554 ◽  
Author(s):  
ANTHONY T. YOUNG ◽  
ELKE ARENHOLZ ◽  
JUN FENG ◽  
HOWARD PADMORE ◽  
STEVE MARKS ◽  
...  
Keyword(s):  
Light Source ◽  
National Laboratory ◽  
X Rays ◽  
X Ray ◽  
Advanced Light Source ◽  
Linearly Polarized ◽  
Linearly Polarized Radiation ◽  
Elliptically Polarized ◽  
Photoemission Electron ◽  
Polarized Radiation

A new undulator beamline at the Advanced Light Source, Lawrence Berkeley National Laboratory is described. This new beamline has an Apple II type undulator which produces linearly and elliptically polarized X-rays. A high resolution monochromator directs the radiation to two branchlines. The first branchline is optimized for spectroscopy and accommodates multiple endstations simultaneously. The second branchline features a photoemission electron microscope. A novel feature of the beamline is the ability to produce linearly polarized radiation at arbitrary, user-selectable angles. Applications of the new beamline are also described.

High-Resolution X-Ray Diffraction Measurements of SiGe/Si Structures

1994 ◽  
Vol 375 ◽  
Author(s):  
J. L. Jordan-Sweet ◽  
P. M. Mooney ◽  
G. B. Stephenson
Keyword(s):  
High Resolution ◽  
Alloy Composition ◽  
Strain Relaxation ◽  
Grazing Incidence ◽  
Diffraction Peak ◽  
Thin Layers ◽  
High Flux ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grazing Incidence Diffraction

AbstractHigh-resolution x-ray diffraction is an excellent probe of strain relaxation in complex SiGe structures. The high flux provided by synchrotron sources enables us to make extensive reciprocal space map measurements and evaluate many samples. The diffraction peak positions of each layer in a step-graded structure, measured for two different reflections, yield quantitative values for the relaxation and alloy composition in the layer. Grazing-incidence diffraction allows us to determine the in-plane structure of very thin layers, which have thickness-broadened peaks at conventional diffraction geometries. We demonstrate the power of these techniques with two examples.

Preparation and characterization of pixelated phosphor screens for high-resolution linear imaging in the vacuum ultraviolet and x-ray ranges

2004 ◽  
Vol 75 (10) ◽  
pp. 3998-4000 ◽  
Author(s):  
L. Rodríguez-Barquero ◽  
B. Zurro ◽  
P. Martin ◽  
K. J. McCarthy ◽  
A. Baciero
Keyword(s):  
High Resolution ◽  
Vacuum Ultraviolet ◽  
X Ray ◽  
Phosphor Screens
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