A nonoptical tip–sample distance control method for near‐field scanning optical microscopy using impedance changes in an electromechanical system

1995 ◽  
Vol 66 (5) ◽  
pp. 3177-3181 ◽  
Author(s):  
J. W. P. Hsu ◽  
Mark Lee ◽  
B. S. Deaver
Keyword(s):  
Optical Microscopy ◽  
Control Method ◽  
Near Field ◽  
Electromechanical System ◽  
Distance Control ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Sample Distance

Non-optical tip-sample distance control method for scanning near-field optical microscopy using a piezoresistive micro cantilever

2001 ◽  
Vol 202 (1) ◽  
pp. 154-161 ◽  
Author(s):  
H. Muramatsu ◽  
A. Egawa ◽  
K. Homma ◽  
J.-M. Kim ◽  
H. Takahashi ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Control Method ◽  
Near Field ◽  
Distance Control ◽  
Micro Cantilever ◽  
Sample Distance

Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy

2001 ◽  
Vol 72 (11) ◽  
pp. 4178-4182 ◽  
Author(s):  
A. Simon ◽  
R. Brunner ◽  
J. O. White ◽  
O. Hollricher ◽  
O. Marti
Keyword(s):  
Optical Microscopy ◽  
Shear Force ◽  
Near Field ◽  
Distance Control ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Raman imaging with near‐field scanning optical microscopy

1995 ◽  
Vol 67 (17) ◽  
pp. 2483-2485 ◽  
Author(s):  
C. L. Jahncke ◽  
M. A. Paesler ◽  
H. D. Hallen
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Raman Imaging ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

Investigations of liquid crystals and liquid ambients using near-field scanning optical microscopy

1995 ◽  
Vol 61 (1-4) ◽  
pp. 291-294 ◽  
Author(s):  
Patrick J. Moyer ◽  
Stefan Kämmer ◽  
Karsten Walzer ◽  
Michael Hietschold
Keyword(s):  
Liquid Crystals ◽  
Optical Microscopy ◽  
Near Field ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning
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