An integrated scanning tunneling, atomic force and lateral force microscope

1994 ◽  
Vol 65 (1) ◽  
pp. 85-88 ◽  
Author(s):  
L. A. Wenzler ◽  
T. Han ◽  
R. S. Bryner ◽  
T. P. Beebe
Keyword(s):  
Lateral Force ◽  
Scanning Tunneling ◽  
Atomic Force ◽  
Lateral Force Microscope

Heterogeneous Oxidation and Precipitation of Aqueous Mn(II) at the Goethite Surface: A SPM Study

1998 ◽  
Vol 4 (S2) ◽  
pp. 600-601
Author(s):  
John Rakovan ◽  
F. Hochella Michael
Keyword(s):  
Lateral Force ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Mineral Surfaces ◽  
Tunneling Microscopy ◽  
Heterogeneous Oxidation ◽  
Force Microscopy ◽  
Solution Interface ◽  
Atomic Force

Since its invention inl982 scanning probe microscopy (SPM) has become an important analytical tool in every branch of physical science. The two most widely used types of SPM are atomic force Microscopy (AFM) and scanning tunneling microscopy (STM). Both AFM and STM allow measurement of the microtopography of a surface down to the atomic scale. Many spin-off applications such as lateral force and magnetic force allow measurement of a variety of the physical properties of a surface while imaging its microtopography. SPM can be done in both air and liquid and hence can be used to observe the interactions that take place at a solid-solution interface.SPM has been used in mineralogy and geochemistry since 1989. Here as in other applications the great strength of SPM is in the characterization of the heterogeneous nature of mineral surfaces and the ability to observe many geochemical processes in real time.

Smart Piezoelectric PZT Microcantilevers with Inherent Sensing and Actuating Abilities for AFM and LFM

1996 ◽  
Vol 459 ◽  
Author(s):  
C. Lee ◽  
T. Itoh ◽  
J. Chu ◽  
T. Ohashi ◽  
R. Maeda ◽  
...  
Keyword(s):  
Sample Surface ◽  
Lateral Force ◽  
Smart Structure ◽  
Thin Layers ◽  
Force Sensing ◽  
Free Standing ◽  
Atomic Force ◽  
Lateral Force Microscope ◽  
Dynamic Scanning ◽  
Piezoelectric Charge

ABSTRACTNovel designs of the force sensing components for an atomic force microscope (AFM) and lateral force microscope (LFM) have been proposed in this study. By using PZT thin layers, a smart structure that can perform force sensing and feedback actuation at the same time is applied to the AFM. Clear images can be derived by an AFM equipped with this smart structure. A structure of two parallel PZT bars integrated on a SiO2 free standing cantilever has shown potential for operation in an LFM, because a difference in the piezoelectric charge outputs from these two beams will be induced by frictional force when the cantilever end quasi-staticly contacts with the sample surface in dynamic scanning across the surface.

scholarly journals Determining amplitude and tilt of a lateral force microscopy sensor

2021 ◽  
Vol 12 ◽  
pp. 517-524
Author(s):  
Oliver Gretz ◽  
Alfred J Weymouth ◽  
Thomas Holzmann ◽  
Korbinian Pürckhauer ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Scanning Tunneling ◽  
Two Dimensional ◽  
Local Surface ◽  
Lateral Force Microscopy ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the amplitude and tilt we make use of the scanning tunneling microscopy (STM) channel and acquire data without and with oscillation of the tip above a local surface feature. We use a full two-dimensional current map of the STM data without oscillation to simulate data for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation.

Ultrasonic Force Microscopic Characterization of Nanosized Copper Particles

1999 ◽  
Vol 581 ◽  
Author(s):  
E. J. Schumaker ◽  
L. Shen ◽  
M. J. Ruddell ◽  
S. Sathish ◽  
P. T. Murray
Keyword(s):  
Quartz Substrate ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope ◽  
Property Measurement ◽  
Cluster Beam Deposition ◽  
Lateral Force Microscope ◽  
Beam Deposition

ABSTRACTAn Ultrasonic Force Microscope capable of imaging elastic modulus variations with nanometer resolution has been developed by modifying a Scanning Probe Microscope. Images of ultrasonic properties have been simultaneously obtained with the topography images. The technique has been utilized to characterize nanoscale copper droplets and grains deposited on a quartz substrate by ionized cluster beam deposition. Images of the same region obtained with atomic force microscope, lateral force microscope, and ultrasonic force microscope are compared. The origin of image contrast in ultrasonic force microscopy and its utilization for quantitative elastic property measurement of nanometer particles are discussed.

Nanolubrication: Patterned Lubricating Films Using Ultraviolet (UV) Irradiation on Hard Disks

2007 ◽  
Vol 7 (1) ◽  
pp. 286-292 ◽  
Author(s):  
J. Zhang ◽  
S. M. Hsu ◽  
Y. F. Liew
Keyword(s):  
Rupture Strength ◽  
Lateral Force ◽  
Hard Disks ◽  
Long Wavelength ◽  
Atomic Force ◽  
Shear Rupture ◽  
Magnetic Hard Disk ◽  
Molecular Layers ◽  
Lateral Force Microscope ◽  
Friction And Wear Characteristics

Nanolubrication is emerging to be the key technical barrier in many devices. One of the key attributes for successful device lubrication is self-sustainability using only several molecular layers. For single molecular species lubrication, one desires bonding strength and molecular mobility to repair the contact by diffusing back to the contact. One way to achieve this is the use of mask to shield the surface with a patterned surface texture, put a monolayer on the surface and induce bonding. Then re-deposit mobile molecules on the surface to bring the thickness back to the desired thickness. This paper describes the use of long wavelength UVirradiation (320–390 nm) to induce bonding of a perfluoropolyether (PFPE) on CNx disks for magnetic hard disk application. This allows the use of irradiation to control the degree of bonding on CNx coatings. The effect of induced bonding based on this wavelength was studied by comparing 100% mobile PFPE, 100% bonded PFPE, and a mixture of mobile and bonded PFPE in a series of laboratory tests. Using a lateral force microscope, a diamond-tipped atomic force microscope, and a ball-on-inclined plane apparatus, the friction and wear characteristics of these three cases were obtained. Results suggested that the mixed PFPE has the highest shear rupture strength.

Lateral force curve for atomic force/lateral force microscope calibration

1995 ◽  
Vol 66 (4) ◽  
pp. 526-528 ◽  
Author(s):  
Satoru Fujisawa ◽  
Eigo Kishi ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Lateral Force ◽  
Force Curve ◽  
Atomic Force ◽  
Lateral Force Microscope

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

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