Lateral force curve for atomic force/lateral force microscope calibration

1995 ◽  
Vol 66 (4) ◽  
pp. 526-528 ◽  
Author(s):  
Satoru Fujisawa ◽  
Eigo Kishi ◽  
Yasuhiro Sugawara ◽  
Seizo Morita
Keyword(s):  
Lateral Force ◽  
Force Curve ◽  
Atomic Force ◽  
Lateral Force Microscope

Smart Piezoelectric PZT Microcantilevers with Inherent Sensing and Actuating Abilities for AFM and LFM

1996 ◽  
Vol 459 ◽  
Author(s):  
C. Lee ◽  
T. Itoh ◽  
J. Chu ◽  
T. Ohashi ◽  
R. Maeda ◽  
...  
Keyword(s):  
Sample Surface ◽  
Lateral Force ◽  
Smart Structure ◽  
Thin Layers ◽  
Force Sensing ◽  
Free Standing ◽  
Atomic Force ◽  
Lateral Force Microscope ◽  
Dynamic Scanning ◽  
Piezoelectric Charge

ABSTRACTNovel designs of the force sensing components for an atomic force microscope (AFM) and lateral force microscope (LFM) have been proposed in this study. By using PZT thin layers, a smart structure that can perform force sensing and feedback actuation at the same time is applied to the AFM. Clear images can be derived by an AFM equipped with this smart structure. A structure of two parallel PZT bars integrated on a SiO2 free standing cantilever has shown potential for operation in an LFM, because a difference in the piezoelectric charge outputs from these two beams will be induced by frictional force when the cantilever end quasi-staticly contacts with the sample surface in dynamic scanning across the surface.

Ultrasonic Force Microscopic Characterization of Nanosized Copper Particles

1999 ◽  
Vol 581 ◽  
Author(s):  
E. J. Schumaker ◽  
L. Shen ◽  
M. J. Ruddell ◽  
S. Sathish ◽  
P. T. Murray
Keyword(s):  
Quartz Substrate ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope ◽  
Property Measurement ◽  
Cluster Beam Deposition ◽  
Lateral Force Microscope ◽  
Beam Deposition

ABSTRACTAn Ultrasonic Force Microscope capable of imaging elastic modulus variations with nanometer resolution has been developed by modifying a Scanning Probe Microscope. Images of ultrasonic properties have been simultaneously obtained with the topography images. The technique has been utilized to characterize nanoscale copper droplets and grains deposited on a quartz substrate by ionized cluster beam deposition. Images of the same region obtained with atomic force microscope, lateral force microscope, and ultrasonic force microscope are compared. The origin of image contrast in ultrasonic force microscopy and its utilization for quantitative elastic property measurement of nanometer particles are discussed.

Nanolubrication: Patterned Lubricating Films Using Ultraviolet (UV) Irradiation on Hard Disks

2007 ◽  
Vol 7 (1) ◽  
pp. 286-292 ◽  
Author(s):  
J. Zhang ◽  
S. M. Hsu ◽  
Y. F. Liew
Keyword(s):  
Rupture Strength ◽  
Lateral Force ◽  
Hard Disks ◽  
Long Wavelength ◽  
Atomic Force ◽  
Shear Rupture ◽  
Magnetic Hard Disk ◽  
Molecular Layers ◽  
Lateral Force Microscope ◽  
Friction And Wear Characteristics

Nanolubrication is emerging to be the key technical barrier in many devices. One of the key attributes for successful device lubrication is self-sustainability using only several molecular layers. For single molecular species lubrication, one desires bonding strength and molecular mobility to repair the contact by diffusing back to the contact. One way to achieve this is the use of mask to shield the surface with a patterned surface texture, put a monolayer on the surface and induce bonding. Then re-deposit mobile molecules on the surface to bring the thickness back to the desired thickness. This paper describes the use of long wavelength UVirradiation (320–390 nm) to induce bonding of a perfluoropolyether (PFPE) on CNx disks for magnetic hard disk application. This allows the use of irradiation to control the degree of bonding on CNx coatings. The effect of induced bonding based on this wavelength was studied by comparing 100% mobile PFPE, 100% bonded PFPE, and a mixture of mobile and bonded PFPE in a series of laboratory tests. Using a lateral force microscope, a diamond-tipped atomic force microscope, and a ball-on-inclined plane apparatus, the friction and wear characteristics of these three cases were obtained. Results suggested that the mixed PFPE has the highest shear rupture strength.

An integrated scanning tunneling, atomic force and lateral force microscope

1994 ◽  
Vol 65 (1) ◽  
pp. 85-88 ◽  
Author(s):  
L. A. Wenzler ◽  
T. Han ◽  
R. S. Bryner ◽  
T. P. Beebe
Keyword(s):  
Lateral Force ◽  
Scanning Tunneling ◽  
Atomic Force ◽  
Lateral Force Microscope

High-Speed Force Curve Measurement based on Atomic Force Observer

2017 ◽  
Vol 137 (10) ◽  
pp. 753-759
Author(s):  
Tomoki Enmei ◽  
Hiroshi Fujimoto ◽  
Yoichi Hori
Keyword(s):  
High Speed ◽  
Force Curve ◽  
Atomic Force

Comparison of atomic force microscopy force curve and solvation structure studied by integral equation theory

2021 ◽  
Vol 154 (16) ◽  
pp. 164702
Author(s):  
Kota Hashimoto ◽  
Ken-ichi Amano ◽  
Naoya Nishi ◽  
Hiroshi Onishi ◽  
Tetsuo Sakka
Keyword(s):  
Integral Equation ◽  
Atomic Force Microscopy ◽  
Integral Equation Theory ◽  
Force Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Solvation Structure

scholarly journals Simultaneous acquisition of current and lateral force signals during AFM for characterising the piezoelectric and triboelectric effects of ZnO nanorods

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Yijun Yang ◽  
Kwanlae Kim
Keyword(s):  
Linear Regression Analysis ◽  
Zno Nanorods ◽  
Lateral Force ◽  
Mechanical Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Simultaneous Acquisition ◽  
Afm Probe ◽  
Triboelectric Effect ◽  
Conversion Efficiencies

AbstractAtomic force microscopy (AFM) is central to investigating the piezoelectric potentials of one-dimensional nanomaterials. The AFM probe is used to deflect individual piezoelectric nanorods and to measure the resultant current. However, the torsion data of AFM probes have not been exploited to elucidate the relationship between the applied mechanical force and resultant current. In this study, the effect of the size of ZnO nanorods on the efficiency of conversion of the applied mechanical force into current was investigated by simultaneously acquiring the conductive AFM and lateral force microscopy signals. The conversion efficiency was calculated based on linear regression analysis of the scatter plot of the data. This method is suitable for determining the conversion efficiencies of all types of freestanding piezoelectric nanomaterials grown under different conditions. A pixel-wise comparison of the current and lateral force images elucidated the mechanism of current generation from dense arrays of ZnO nanorods. The current signals generated from the ZnO nanorods by the AFM probe originated from the piezoelectric and triboelectric effects. The current signals contributed by the triboelectric effect were alleviated by using an AFM probe with a smaller spring constant and reducing the normal force.

Approximate Real-Time Force Spectroscopy Within Amplitude-Modulation Atomic Force Microscopy Topographical Imaging Using Few Harmonics and Fourier Methods

2021 ◽  
Author(s):  
Berkin Uluutku ◽  
Santiago D. Solares
Keyword(s):  
Atomic Force Microscopy ◽  
Signal To Noise Ratio ◽  
Gaussian Model ◽  
Force Curve ◽  
Simple Method ◽  
Force Microscopy ◽  
Electromagnetic Interactions ◽  
Atomic Force ◽  
Mechanical Deformations ◽  
Specialized Hardware

Abstract Quantitative measurement of the probe-sample interaction forces as a function of distance and time during imaging has been at the forefront of atomic force microscopy (AFM) research. This type of information is extremely valuable for understanding the material response to a variety of stimuli and interactions, such as mechanical deformations that vary in magnitude and rate of application, chemical interactions, or electromagnetic interactions. A variety of methods for performing such measurements simultaneously with topographical imaging is available, including methods based on Fourier analysis. Within these methods, reconstruction of the tip-sample force curve generally requires measurement of a large number of harmonics of the probe oscillation, which presents challenges such as the need for specialized hardware, low signal-to-noise ratio, and the need for extensive user expertise. In this paper, we present a simple method to perform a Gaussian-model-based fit of the tip-sample force curve across the surface, simultaneously with imaging, which requires measurement of only the first two or three harmonics for elastic materials. While such an approach only offers an approximate representation of the force curve, it can be highly accurate and fast, and has low instrumentation requirements, such that it can be relatively simple to implement on most commercial AFM setups.

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