The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale

1993 ◽  
Vol 64 (10) ◽  
pp. 2911-2919 ◽  
Author(s):  
D. Blavette ◽  
B. Deconihout ◽  
A. Bostel ◽  
J. M. Sarrau ◽  
M. Bouet ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Tomographic Atom Probe

Atomic-scale study of TbCo2.5/Fe multilayers by laser-assisted tomographic atom probe

2007 ◽  
Vol 102 (3) ◽  
pp. 033912 ◽  
Author(s):  
A. Grenier ◽  
R. Lardé ◽  
E. Cadel ◽  
F. Vurpillot ◽  
J. Juraszek ◽  
...  
Keyword(s):  
Atom Probe ◽  
Atomic Scale ◽  
Tomographic Atom Probe

Three-Dimensional Nanoanalysis with the Tomographic Atom-Probe

1996 ◽  
pp. 183-194
Author(s):  
Didier Blavette ◽  
Annabelle Bigot ◽  
Cristelle Schmuck ◽  
Frédéric Danoix ◽  
Pierre Auger
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Tomographic Atom Probe

Atomic Scale Characterisation of Electrodeposited Nanocrystalline Ni-P Alloys

1999 ◽  
Vol 581 ◽  
Author(s):  
Matthias Abraham ◽  
Mattias Thuvandert ◽  
Helen M. Lane ◽  
Alfred Cerezo ◽  
George D.W. Smith
Keyword(s):  
Heat Treatment ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Three Dimensional ◽  
Boundary Segregation ◽  
Atom Probe ◽  
Atomic Scale ◽  
Grain Boundary Segregation ◽  
P Concentration

ABSTRACTNanocrystalline Ni-P alloys produced by electrodeposition have been characterised by three-dimensional atom probe (3DAP) analysis. In the as-deposited materials, there are indications of some variation in P concentration between grains and segregation to grain boundaries. After heat treatment however, strong grain boundary segregation and the formation of Ni3P precipitates have been observed.

scholarly journals Atom Probe Analysis of Ex Situ Gas-Charged Stable Hydrides

2017 ◽  
Vol 23 (2) ◽  
pp. 307-313 ◽  
Author(s):  
Daniel Haley ◽  
Paul A. J. Bagot ◽  
Michael P. Moody
Keyword(s):  
Atom Probe Tomography ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Ex Situ ◽  
Native Oxide ◽  
Probe Analysis ◽  
Atom Probe Tomography Analysis ◽  
Hydrogen Analysis ◽  
Atom Probe Analysis

AbstractIn this work, we report on the atom probe tomography analysis of two metallic hydrides formed by pressurized charging using an ex situ hydrogen charging cell, in the pressure range of 200–500 kPa (2–5 bar). Specifically we report on the deuterium charging of Pd/Rh and V systems. Using this ex situ system, we demonstrate the successful loading and subsequent atom probe analysis of deuterium within a Pd/Rh alloy, and demonstrate that deuterium is likely present within the oxide–metal interface of a native oxide formed on vanadium. Through these experiments, we demonstrate the feasibility of ex situ hydrogen analysis for hydrides via atom probe tomography, and thus a practical route to three-dimensional imaging of hydrogen in hydrides at the atomic scale.

True Atomic-Scale Imaging in Three Dimensions: A Review of the Rebirth of Field-Ion Microscopy

2017 ◽  
Vol 23 (2) ◽  
pp. 210-220 ◽  
Author(s):  
Francois Vurpillot ◽  
Frédéric Danoix ◽  
Matthieu Gilbert ◽  
Sebastian Koelling ◽  
Michal Dagan ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Image Sequences ◽  
Atomic Scale ◽  
Three Dimensions ◽  
Physical Metallurgy ◽  
Science And Engineering ◽  
Computing Power ◽  
Field Ion Microscopy ◽  
Ion Microscopy

AbstractThis article reviews recent advances utilizing field-ion microscopy (FIM) to extract atomic-scale three-dimensional images of materials. This capability is not new, as the first atomic-scale reconstructions of features utilizing FIM were demonstrated decades ago. The rise of atom probe tomography, and the application of this latter technique in place of FIM has unfortunately severely limited further FIM development. Currently, the ubiquitous availability of extensive computing power makes it possible to treat and reconstruct FIM data digitally and this development allows the image sequences obtained utilizing FIM to be extremely valuable for many material science and engineering applications. This article demonstrates different applications of these capabilities, focusing on its use in physical metallurgy and semiconductor science and technology.

Atom Probe Microscopy and its Future

1994 ◽  
Vol 332 ◽  
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
D. J. Larson ◽  
L. M. Holzman
Keyword(s):  
Materials Science ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Level ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Probe Field ◽  
Transmission Electron ◽  
Indispensable Tool ◽  
3D Information

ABSTRACTMuch of the current activity and excitement in materials science involves processing and understanding materials at the atomic scale. Accordingly, it is necessary for materials scientists to control and characterize materials at the atomic level. There are only a few microscopies that are capable of providing information about the structure of materials at the atomic level: the atom probe field ion microscope, the high resolution transmission electron microscope, and the scanning tunneling microscope. The three-dimensional atom probe (3DAP) determines the 3D location and elemental identity of each atom in a sample. It is the only technique that provides 3D information at the atomic scale.The origin and underlying concepts behind the 3DAP are described. Several examples of actual images from existing 3DAPs are shown with emphasis on nanometer-scale analysis. Current limitations of the technique and expected future developments in this form of microscopy are described. It is our opinion that 3D atomic-scale imaging will be an indispensable tool in materials science in the coming decades.

On the Physics of Anomalies of Boron Nanosegregation at Dislocations in FeAl

2019 ◽  
Vol 391 ◽  
pp. 246-250
Author(s):  
Yuriy S. Nechaev ◽  
Andreas Öchsner
Keyword(s):  
Mechanical Properties ◽  
Critical Analysis ◽  
Diffusion Processes ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Metallic Materials ◽  
Probe Field ◽  
Ion Microscopy ◽  
And Diffusion

We present results of the constructive critical analysis and interpretation of some recent studies (Blavette, Sauvage, Wilde and others) at the atomic scale (using three-dimensional atom-probe field-ion microscopy) of impurity nanosegregation at dislocations, including “Cottrell atmospheres”, and grain boundaries in deformed intermetallics and metallic materials, and their relevance to mechanical properties and diffusion processes.

Three-dimensional reconstruction of atomic-scale composition with the position-sensitive atom probe

1992 ◽  
Vol 50 (2) ◽  
pp. 1478-1479
Author(s):  
G.D.W. Smith ◽  
A. Cerezo ◽  
C.R.M. Grovenor ◽  
T.J. Godfrey ◽  
R.P. Setna
Keyword(s):  
Mass Spectrometer ◽  
Three Dimensional ◽  
Atom Probe ◽  
Atomic Scale ◽  
Single Atom ◽  
Small Aperture ◽  
Dimensional Reconstruction ◽  
Position Sensitive ◽  
Atom Level ◽  
Scale Composition

The combination of a field ion microscope with a time-of-flight mass spectrometer provides the capability for chemical microanalysis at the single atom level. Such an instrument is termed an Atom Probe. Conventionally, the connection between the microscope and the mass spectrometer is made via a small aperture hole in the imaging screen. This defines a region on the specimen, typically about 2nm across, from which the analysis is obtained. The disadvantage of this arrangement is that other regions of the specimen cannot be examined, as ions from all but the selected area strike the image screen and therefore do not pass into the mass spectrometer. In order to overcome this problem, we have developed a version of the Atom Probe which incorporates a wide-angle position sensitive detector system. This instrument, which we have termed the POSAP, is shown schematically in figure 1. Typically, the field of view in this instrument is about 20nm across. The number of ions collected per atom layer removed from the specimen surface is therefore approximately 5,000.

Prospects for compositional imaging with the atom probe microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1616-1617
Author(s):  
T. F. Kelly ◽  
P. P. Camus ◽  
J. J. McCarthy ◽  
D. J. Larson ◽  
L. M. Holzman ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Compositional Analysis ◽  
Atom Probe ◽  
Atomic Scale ◽  
Probe Field ◽  
Acquisition Rate ◽  
3D Data ◽  
Probe Microscope ◽  
Position Sensitive ◽  
Field Ion Microscope

For the purposes of analytical characterization on the atomic scale, the ultimate instrument would identify every atom in a sample and determine its position with atomic-scale resolution. The recently developed positionsensitive atom probe (POSAP) comes as close as yet possible to this goal. This is the only experimental technique which can analyze the three-dimensional (3D) composition of a sample on a sub-nanometer scale.By adding a position-sensitive detector (PSD) to a conventional atom probe/field ion microscope, a 3D data structure with position-correlated compositional analysis is acquired. The 3D data are stored on a computer and may be examined for structural and compositional information at an atomic level. Note that, because it uses time-of-flight mass spectroscopy, all elements and their isotopes are detected in this way with equal proficiency. Usually, the evaporation rate is mediated by pulsing the field on the specimen. This approach, however, severely limits the data acquisition rate (about 1 atom per second) and mass resolution (about 1 part in 30).

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