A double‐crystal x‐ray monochromator in antiparallel position with a sagittally bent crystal

1993 ◽  
Vol 64 (8) ◽  
pp. 2207-2210
Author(s):  
Jaromír Hrdý
Keyword(s):  
Double Crystal ◽  
X Ray ◽  
Bent Crystal ◽  
Antiparallel Position

Characterization and on-line adjustment of the sagittal-bent Laue crystal profile

2018 ◽  
Vol 25 (5) ◽  
pp. 1346-1353
Author(s):  
Weiwei Dong ◽  
Quan Cai ◽  
Fugui Yang ◽  
Xu Liu ◽  
Jiaowang Yang ◽  
...  
Keyword(s):  
Ray Tracing ◽  
Crystal Surface ◽  
Great Influence ◽  
High Energy ◽  
Double Crystal ◽  
X Ray ◽  
Bent Crystal ◽  
On Line ◽  
Condition Adjustment ◽  
Anticlastic Curvature

The sagittal-bent Laue monochromator can provide an ideal way to focus high-energy X-ray beams. However, the anticlastic curvature induced by sagittal bending has a great influence on the crystal performance. Thus, characterizing the bent-crystal shape is very important for predicting the performance of the bent-crystal monochromator. In this paper the crystal profile is measured by off-line optical metrology and on-line X-ray experiments. The off-line results showed that the bent-crystal surface could be well fitted to a saddle surface apart from a redundant cubic term which was related to the different couples applied on the crystal. On-line characterization of the meridional and the sagittal radius of the bent crystal includes double-crystal topography and ray-tracing measurement. In addition, the double-crystal topography experiment could be used as a quick diagnostic method for the bending condition adjustment. The sagittal radius of the bent crystal was characterized through a ray-tracing experiment by using a particularly designed tungsten mask. Moreover, rocking curves under different bending conditions were measured as well. The results were highly consistent with analytical results derived from the elastic theory. Furthermore, radii along different vertical positions under various bending conditions were measured and showed a quadratic relationship between the vertical positions and the meridional radii.

scholarly journals New methods of X-ray spectroscopy of laser-produced plasmas with one-dimensional spatial resolution

1994 ◽  
Vol 12 (3) ◽  
pp. 539-548 ◽  
Author(s):  
O. Renner ◽  
M. Kopecký ◽  
E. Krouský ◽  
E. Förster ◽  
T. Missalla ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
High Dispersion ◽  
Crystal Spectrometer ◽  
Double Crystal ◽  
One Dimensional ◽  
X Ray ◽  
Bent Crystal ◽  
New Methods ◽  
Vertical Dispersion ◽  
Preliminary Experimental Data

Two novel high-dispersion, high-resolution spectroscopic methods are described. The properties of the vertical dispersion variants of the double-crystal spectrometer and the Johann spectrometer with a cylindrically bent crystal are discussed and compared with those of standard spectroscopic schemes. Preliminary experimental data demonstrate the good luminosity and extreme spectral and 1-D spatial resolution of these methods, which should prove useful in high-precision X-ray spectroscopic measurements of laser-produced plasmas.

Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies

2001 ◽  
Vol 34 (5) ◽  
pp. 646-653 ◽  
Author(s):  
Z. Zhong ◽  
C. C. Kao ◽  
D. P. Siddons ◽  
J. B. Hastings
Keyword(s):  
Focal Length ◽  
Experimental Studies ◽  
High Energy ◽  
X Rays ◽  
Horizontal Position ◽  
Double Crystal ◽  
X Ray ◽  
Bent Crystal ◽  
Planar Crystal ◽  
Diffraction Angle

The use of bent asymmetric Laue crystals to focus synchrotron X-rays sagittally from 15 to 50 keV is described. A four-bar bender, bending a rectangular planar crystal, produced the necessary sagittal and meridional bending for this unique application. Adjustments of the tilt angle and height of the bent crystal resulted in first- and second-order corrections, respectively, to the dependence of the angle of diffraction on the horizontal position on the crystal. After these corrections, the remaining variation of the diffraction angle was of the order of 10 µrad. The theoretical sagittal focal length was verified. A prototype of a double-crystal sagittally focusing monochromator was constructed and tested, using two identical Laue crystals. A horizontal divergence of 3 mrad was focused to a horizontal dimension of about 0.4 mm. The X-ray flux density at the focus was a few hundred times larger than that of unfocused X-rays.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

A DOUBLE CRYSTAL MONOCHROMATOR FOR SOFT X-RAY BEAM LINE OF UVSOR

1986 ◽  
Vol 47 (C8) ◽  
pp. C8-135-C8-137
Author(s):  
T. MURATA ◽  
T. MATSUKAWA ◽  
M. MORI ◽  
M. OBASHI ◽  
S.-I. NAO-E ◽  
...  
Keyword(s):  
Beam Line ◽  
Double Crystal ◽  
X Ray ◽  
Double Crystal Monochromator

Double Crystal X‐Ray Dilatometer Using Continuous Radiation

1971 ◽  
Vol 42 (2) ◽  
pp. 196-199 ◽  
Author(s):  
Virgil E. Bottom ◽  
Renê Ayres Carvalho
Keyword(s):  
Double Crystal ◽  
X Ray ◽  
Continuous Radiation

Strain Shift Coefficients for Phonons in Si-Ge Heterostructures

1991 ◽  
Vol 239 ◽  
Author(s):  
J.-M. Baribeau ◽  
D. J. Lockwood
Keyword(s):  
Molecular Beam ◽  
Composition Dependence ◽  
Vibration Mode ◽  
Phonon Frequency ◽  
Longitudinal Optical ◽  
Stress Factor ◽  
Double Crystal ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Shift Coefficient

ABSTRACTStrain shift coefficient measurements for longitudinal optical phonons in molecular beam epitaxy grown metastable pseudomorphic Si1−xGex layers on (100) Si (0 < x < 0.35) and Ge (0.80 < x < 1) are reported. Strain in partially relaxed annealed specimens was obtained by double-crystal x-ray diffractometry and the corresponding strain phonon shift was measured by Raman scattering spectroscopy. For epilayers grown on Si it was found that the epilayer Si-Si phonon frequency varies linearly with strain. The magnitude of the strain shift coefficient b however showed a small composition dependence varying from b ≈ -700 cm-1 at x = 0 to b ≈ -950 cm-1 at x = 0.35, corresponding to a stress factor τ = 0.40 + 0.57x: + 0.13x2 cm-1/kbar. For the Ge-Ge vibration mode in epilayers grown on Ge, b decreased from ∼-425 cm-1 at x = 1 to ∼-500 cm-1 at x = 0.8, corresponding to a stress factor τ ≈ 0.52 – 0.14x - 0.08x2 cm-1/kbar.

Assessment of Thin Heteroepitaxial Layers Using Skew Angle Asymmetrical X-Ray Double Crystal Diffraction

1988 ◽  
Vol 138 ◽  
Author(s):  
S. J. Miles ◽  
G. S. Green ◽  
B. K. Tanner ◽  
M. A. G. Halliwell ◽  
M. H. Lyons
Keyword(s):  
Skew Angle ◽  
Double Crystal ◽  
X Ray ◽  
Heteroepitaxial Layers

Bent Crystal X‐Ray Monochromators

1950 ◽  
Vol 21 (1) ◽  
pp. 102-102 ◽  
Author(s):  
B. E. Warren
Keyword(s):  
X Ray ◽  
Bent Crystal

scholarly journals Bent crystal x-ray mirrors for time-resolved experiments with femtosecond laser-produced x-ray pulses

2005 ◽  
Vol 21 ◽  
pp. 207-210 ◽  
Author(s):  
M Nicoul ◽  
U Shymanovich ◽  
S Kähle ◽  
T Caughey ◽  
D Sampat ◽  
...  
Keyword(s):  
Femtosecond Laser ◽  
Time Resolved ◽  
X Ray ◽  
Bent Crystal
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