Bent crystal, bent multilayer optics on a multipole wiggler line for an x‐ray diffractometer with an imaging plate detector

1992 ◽  
Vol 63 (1) ◽  
pp. 982-987 ◽  
Author(s):  
R. Fourme ◽  
P. Dhez ◽  
J. P. Benoit ◽  
R. Kahn ◽  
J. M. Dubuisson ◽  
...  
Keyword(s):  
Imaging Plate ◽  
X Ray ◽  
Bent Crystal ◽  
Imaging Plate Detector

Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy

2007 ◽  
Author(s):  
Yoshinori Nishino ◽  
Yukio Takahashi ◽  
Masaki Yamamoto ◽  
Tetsuya Ishikawa
Keyword(s):  
Imaging Plate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy ◽  
Imaging Plate Detector

A high-temperature furnace for X-ray diffraction with directly machined α-Al2O3ceramic parts

1999 ◽  
Vol 32 (4) ◽  
pp. 833-836 ◽  
Author(s):  
Michael Estermann ◽  
Hans Reifler ◽  
Walter Steurer ◽  
Frank Filser ◽  
Peter Kocher ◽  
...  
Keyword(s):  
High Temperature ◽  
Synchrotron Radiation ◽  
Ceramic Materials ◽  
Imaging Plate ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Temperature Furnace ◽  
Sintering Shrinkage ◽  
Imaging Plate Detector ◽  
Temperature Furnace

A complex high-temperature furnace has been produced from presintered α-Al2O3precompacts. The furnace is designed for the Mar345 imaging-plate detector system. Up to now, the design complexity of ceramic parts has been limited by the difficulty of machining hard ceramic materials or by the moulds used in hot-pressing and casting. However, the machining of soft presintered ceramic materials enables the realisation of much more demanding designs, provided that the final sintering shrinkage of the ceramic is homogeneous and predictable. The design of the furnace and its realisation and application in an X-ray diffraction study with synchrotron radiation are presented.

Imaging Plate Detector In X-Ray Diffraction Using Synchrotron Radiation

1989 ◽  
Author(s):  
Yoshiyuki Amemiya ◽  
Atsushi Nakagawa ◽  
Shunji Kishimoto ◽  
Tadashi Matsushita ◽  
Masami Ando ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Imaging Plate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Imaging Plate Detector

A wide-bandpass multilayer monochromator and its application to the determination of absolute structure

2004 ◽  
Vol 37 (1) ◽  
pp. 136-142
Author(s):  
T. Koganezawa ◽  
K. Uno ◽  
H. Iwasaki ◽  
N. Nakamura ◽  
Y. Yoshimura ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Absorption Edge ◽  
Wide Band ◽  
Imaging Plate ◽  
Parallel Beam ◽  
X Ray ◽  
Diffraction Patterns ◽  
Absolute Structure ◽  
Imaging Plate Detector

A diffraction system has been constructed at the Synchrotron Radiation Centre at Ritsumeikan University, in which a wide-band parallel X-ray beam is produced by reflection from the depth-graded multilayer monochromator. The band width is 600 eV and the monochromator is useful in the photon energy range from 6500 to 7700 eV. In diffraction patterns of an oscillating single crystal recorded using the beam, Bragg reflections appear in an elongated form on an imaging-plate detector and, if the absorption edge of an atom in the crystal is included in the band, a characteristic intensity profile is seen due to anomalous dispersion. As an application of the system, the absolute configuration was determined for a newly synthesized compound, 4-(1-hydroxyethyl)phenylferrocene, C18H18FeO, with an enantiomorphic structure, choosing the Fe atoms as anomalous scatterers. In the intensity profiles of the Friedel pairs of reflections, clear contrast between the pair was observed at the absorption edge, leading unequivocally to theSform. Further possible application of the wide-bandpass parallel beam is discussed.

X-ray diffraction properties of curved crystal diffractors

1992 ◽  
Vol 50 (2) ◽  
pp. 1734-1735
Author(s):  
W. Z. Chang ◽  
D. B. Wittry
Keyword(s):  
Diffraction Theory ◽  
X Rays ◽  
Diffraction Image ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Bent Crystal ◽  
Diffraction Geometry ◽  
Crystal Parameter ◽  
Quantitative Procedure

Since Du Mond and Kirkpatrick first discussed the principle of a bent crystal spectrograph in 1930, curved single crystals have been widely utilized as spectrometric monochromators as well as diffractors for focusing x rays diverging from a point. Curved crystal diffraction theory predicts that the diffraction parameters - the rocking curve width w, and the peak reflection coefficient r of curved crystals will certainly deviate from those of their flat form. Due to a lack of curved crystal parameter data in current literature and the need for optimizing the choice of diffraction geometry and crystal materials for various applications, we have continued the investigation of our technique presented at the last conference. In the present abstract, we describe a more rigorous and quantitative procedure for measuring the parameters of curved crystals.The diffraction image of a singly bent crystal under study can be obtained by using the Johann geometry with an x-ray point source.

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