Imaging Plate Detector In X-Ray Diffraction Using Synchrotron Radiation

1989 ◽  
Author(s):  
Yoshiyuki Amemiya ◽  
Atsushi Nakagawa ◽  
Shunji Kishimoto ◽  
Tadashi Matsushita ◽  
Masami Ando ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Imaging Plate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Imaging Plate Detector

A high-temperature furnace for X-ray diffraction with directly machined α-Al2O3ceramic parts

1999 ◽  
Vol 32 (4) ◽  
pp. 833-836 ◽  
Author(s):  
Michael Estermann ◽  
Hans Reifler ◽  
Walter Steurer ◽  
Frank Filser ◽  
Peter Kocher ◽  
...  
Keyword(s):  
High Temperature ◽  
Synchrotron Radiation ◽  
Ceramic Materials ◽  
Imaging Plate ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Temperature Furnace ◽  
Sintering Shrinkage ◽  
Imaging Plate Detector ◽  
Temperature Furnace

A complex high-temperature furnace has been produced from presintered α-Al2O3precompacts. The furnace is designed for the Mar345 imaging-plate detector system. Up to now, the design complexity of ceramic parts has been limited by the difficulty of machining hard ceramic materials or by the moulds used in hot-pressing and casting. However, the machining of soft presintered ceramic materials enables the realisation of much more demanding designs, provided that the final sintering shrinkage of the ceramic is homogeneous and predictable. The design of the furnace and its realisation and application in an X-ray diffraction study with synchrotron radiation are presented.

Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy

2007 ◽  
Author(s):  
Yoshinori Nishino ◽  
Yukio Takahashi ◽  
Masaki Yamamoto ◽  
Tetsuya Ishikawa
Keyword(s):  
Imaging Plate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy ◽  
Imaging Plate Detector

A wide-bandpass multilayer monochromator and its application to the determination of absolute structure

2004 ◽  
Vol 37 (1) ◽  
pp. 136-142
Author(s):  
T. Koganezawa ◽  
K. Uno ◽  
H. Iwasaki ◽  
N. Nakamura ◽  
Y. Yoshimura ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Absorption Edge ◽  
Wide Band ◽  
Imaging Plate ◽  
Parallel Beam ◽  
X Ray ◽  
Diffraction Patterns ◽  
Absolute Structure ◽  
Imaging Plate Detector

A diffraction system has been constructed at the Synchrotron Radiation Centre at Ritsumeikan University, in which a wide-band parallel X-ray beam is produced by reflection from the depth-graded multilayer monochromator. The band width is 600 eV and the monochromator is useful in the photon energy range from 6500 to 7700 eV. In diffraction patterns of an oscillating single crystal recorded using the beam, Bragg reflections appear in an elongated form on an imaging-plate detector and, if the absorption edge of an atom in the crystal is included in the band, a characteristic intensity profile is seen due to anomalous dispersion. As an application of the system, the absolute configuration was determined for a newly synthesized compound, 4-(1-hydroxyethyl)phenylferrocene, C18H18FeO, with an enantiomorphic structure, choosing the Fe atoms as anomalous scatterers. In the intensity profiles of the Friedel pairs of reflections, clear contrast between the pair was observed at the absorption edge, leading unequivocally to theSform. Further possible application of the wide-bandpass parallel beam is discussed.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

Visualization of spontaneous electronic polarization in Pb ion of ferroelectric PbTiO3 by synchrotron-radiation x-ray diffraction

2020 ◽  
Vol 117 (25) ◽  
pp. 252905
Author(s):  
Tomohiro Abe ◽  
Sangwook Kim ◽  
Chikako Moriyoshi ◽  
Yuuki Kitanaka ◽  
Yuji Noguchi ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
X Ray Diffraction ◽  
Electronic Polarization ◽  
X Ray
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