Elliptical‐polarization measurements in the vacuum ultraviolet and soft x‐ray regions with a reflection polarimeter

1992 ◽  
Vol 63 (1) ◽  
pp. 1458-1461 ◽  
Author(s):  
T. Koide ◽  
T. Shidara ◽  
M. Yuri ◽  
N. Kandaka ◽  
H. Fukutani ◽  
...  
2005 ◽  
Author(s):  
K. Kobayashi ◽  
E. A. West ◽  
M. Noble

2021 ◽  
Vol 42 (11) ◽  
pp. 1756-1762
Author(s):  
Qiu-feng SHI ◽  
◽  
Lei WANG ◽  
Hai-jie GUO ◽  
Ping HUANG ◽  
...  

2000 ◽  
Vol 14 (15) ◽  
pp. 563-570 ◽  
Author(s):  
M. ZAKAULLAH ◽  
IJAZ AKHTAR ◽  
S. F. MEHMOOD ◽  
A. WAHEED ◽  
G. MURTAZA

A time-resolved rugged X-ray detector (XRD) which may be used in intense radiation environment is developed. The detector is used to study the X-ray emission from a low-energy (2.3 kJ) Mather-type plasma focus energized by a 32 μF single capacitor, using hydrogen and argon (3:2) mixture as gas filling. In the detector, the electron emitter is made of nickel and aluminum. The sensitivity of the detector with nickel cathode is found to be very low. No signal could be recorded by masking the detector with even the 2 μm thick Al foil. When Al cathode is used in the XRD, the sensitivity of the detector increases abruptly. To stop the optical/ultraviolet radiation from approaching the active area, it is masked with 6 μm Al filter. It is found that an XRD with nickel cathode is not useful for X-ray detection in a low-energy plasma focus. However, due to its excellent response to vacuum ultraviolet radiation (≤600 Å), it may find application in the study of the axial rundown of current sheath, and its velocity. The X-ray emission from focus plasma is the highest at 0.5 mbar. With increase in pressure, the emission is dropped. At filling pressures of 2.0–2.5 mbar, the X-ray emission increases again. High X-ray emission at 0.5 mbar is due to interaction of energetic electrons in the current sheath with the anode surface, whereas moderately high emission at 2.0–2.5 mbar is caused by an axially moving shockwave.


1990 ◽  
Vol 101 (2-3) ◽  
pp. 273-282 ◽  
Author(s):  
M.-J. Hubin-Franskin ◽  
J. Delwiche ◽  
M. Furlan ◽  
K. Ibrahim ◽  
R. Thissen ◽  
...  

2020 ◽  
Vol 3 (1) ◽  
Author(s):  
Hanzhe Liu ◽  
Giulio Vampa ◽  
Jingyuan Linda Zhang ◽  
Yu Shi ◽  
Siddharth Buddhiraju ◽  
...  

Abstract Since the new millennium coherent extreme ultra-violet and soft x-ray radiation has revolutionized the understanding of dynamical physical, chemical and biological systems at the electron’s natural timescale. Unfortunately, coherent laser-based upconversion of infrared photons to vacuum-ultraviolet and soft x-ray high-order harmonics in gaseous, liquid and solid targets is notoriously inefficient. In dense nonlinear media, the limiting factor is strong re-absorption of the generated high-energy photons. Here we overcome this limitation by generating high-order harmonics from a periodic array of thin one-dimensional crystalline silicon ridge waveguides. Adding vacuum gaps between the ridges avoids the high absorption loss of the bulk and results in a ~ 100-fold increase of the extraction depth. As the grating period is varied, each high harmonic shows a different and marked modulation, indicating their waveguiding in the vacuum slots with reduced absorption. Looking ahead, our results enable bright on-chip coherent short-wavelength sources and may extend the usable spectral range of traditional nonlinear crystals to their absorption windows. Potential applications include on-chip chemically-sensitive spectro-nanoscopy.


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