Instrumentation for gas electron diffraction employing a pulsed electron beam synchronous with photoexcitation

1992 ◽  
Vol 63 (6) ◽  
pp. 3352-3358 ◽  
Author(s):  
John D. Ewbank ◽  
Walter L. Faust ◽  
Jing Y. Luo ◽  
Jeffrey T. English ◽  
David L. Monts ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Gas Electron Diffraction ◽  
Pulsed Electron Beam

Annealing of High Dose C Implanted Si by Pulsed Electron Beam

1983 ◽  
Vol 23 ◽  
Author(s):  
P. Durupt ◽  
D. Barbier ◽  
A. Laugier
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Thermal Annealing ◽  
Rutherford Backscattering ◽  
Low Energy ◽  
High Dose ◽  
Pulsed Electron Beam ◽  
Beam Characterization

ABSTRACTHigh dose (1–7 1017cm−2), low energy (10–40 keV) C implanted Si samples were annealed by conventional thermal procedure and by pulsed electron beam. Characterization is performed by I.R., electron diffraction and Rutherford Backscattering. Effect of PEBA is equivalent to thermal annealing at 900°C. No C redistribution occurs and a poor recrystallization of the SiC formed during implantation is observed.

Quanitative aspects of electron diffraction using electron holography

1995 ◽  
Vol 53 ◽  
pp. 616-617
Author(s):  
E. Völkl ◽  
L.F. Allard ◽  
B. Frost ◽  
T.A. Nolan
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Software Package ◽  
Spatial Coherence ◽  
Electron Holography ◽  
Image Intensity ◽  
Interference Fringes ◽  
Complex Image ◽  
The Difference ◽  
Recorded Image

Off-axis electron holography has the well known ability to preserve the complex image wave within the final, recorded image. This final image described by I(x,y) = I(r) contains contributions from the image intensity of the elastically scattered electrons IeI (r) = |A(r) exp (iΦ(r)) |, the contributions from the inelastically scattered electrons IineI (r), and the complex image wave Ψ = A(r) exp(iΦ(r)) as:(1) I(r) = IeI (r) + Iinel (r) + μ A(r) cos(2π Δk r + Φ(r))where the constant μ describes the contrast of the interference fringes which are related to the spatial coherence of the electron beam, and Φk is the resulting vector of the difference of the wavefront vectors of the two overlaping beams. Using a software package like HoloWorks, the complex image wave Ψ can be extracted.

Analysis of Desorbed Gases from Oxygen-free Copper Stimulated by Irradiation with Single Pulsed Electron Beam

2012 ◽  
Vol 132 (11) ◽  
pp. 951-957
Author(s):  
Hiroki Kaneko ◽  
Yasushi Yamano ◽  
Shinichi Kobayashi ◽  
Yoshio Saito
Keyword(s):  
Electron Beam ◽  
Pulsed Electron Beam

Combined gas electron diffraction and mass spectrometric experimental setup at Bielefeld University

2020 ◽  
Vol 91 (7) ◽  
pp. 073103
Author(s):  
Yury V. Vishnevskiy ◽  
Sebastian Blomeyer ◽  
Christian G. Reuter ◽  
Oleg A. Pimenov ◽  
Sergey A. Shlykov
Keyword(s):  
Electron Diffraction ◽  
Mass Spectrometric ◽  
Gas Electron Diffraction ◽  
Experimental Setup

scholarly journals The Effect of a Pulsed Electron Beam on Damage Threshold

2018 ◽  
Vol 24 (S1) ◽  
pp. 2002-2003 ◽  
Author(s):  
Elisah J. VandenBussche ◽  
David J. Flannigan
Keyword(s):  
Electron Beam ◽  
Damage Threshold ◽  
Pulsed Electron Beam

The structure and properties of boron carbide ceramics modified by high-current pulsed electron-beam

2016 ◽  
Author(s):  
Yuri Ivanov ◽  
Oleg Tolkachev ◽  
Maria Petyukevich ◽  
Anton Teresov ◽  
Olga Ivanova ◽  
...  
Keyword(s):  
Electron Beam ◽  
Boron Carbide ◽  
Structure And Properties ◽  
High Current ◽  
Pulsed Electron Beam ◽  
Carbide Ceramics
Sign in / Sign up

Export Citation Format

Share Document