scholarly journals Profile correction to electron temperature and enhancement factor in soft‐x‐ray pulse‐height‐analysis measurements in tokamaks

1988 ◽  
Vol 59 (8) ◽  
pp. 1810-1812 ◽  
Author(s):  
S. Sesnic ◽  
M. Diesso ◽  
K. Hill ◽  
A. Holland ◽  
F. Pohl
Keyword(s):  
Electron Temperature ◽  
Enhancement Factor ◽  
Pulse Height ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Profile Correction

A new soft x-ray pulse height analysis array in the HL-2A tokamak

2009 ◽  
Vol 80 (12) ◽  
pp. 126104 ◽  
Author(s):  
Y. P. Zhang ◽  
Yi Liu ◽  
J. W. Yang ◽  
X. Y. Song ◽  
M. Liao ◽  
...  
Keyword(s):  
Pulse Height ◽  
X Ray ◽  
Pulse Height Analysis

scholarly journals Chemical Bonding and the Sulfur K X-Ray Spectrum

1965 ◽  
Vol 9 ◽  
pp. 354-364 ◽  
Author(s):  
D. W. Wilbur ◽  
J. W. Gofman
Keyword(s):  
Electronic Structure ◽  
Single Crystal ◽  
Organic Compounds ◽  
Sulfur Atom ◽  
Chemical Bonding ◽  
Proportional Counter ◽  
Pulse Height ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Chemical States

AbstractAn investigation has been made of the relative Kβ intensities in different chemical states of the sulfur atom using the Kα lines, with appropriate corrections, to provide the intensity standards. Both inorganic and organic compounds were included in the study. The data for each compound appear to be reliable to about ± 0.5%, while the whole series of compounds shows a variation greater than 20% in the corrected Kβ/Kα ratios. Energies were also measured, particularly the Kα energies, and their shifts were studied relative to the Kβ, intensity shifts. The work was done with a plane, single-crystal, helium-path spectrometer with proportional counter and pulse-height analysis for detection. The results are indicative of the usefulness of the method both in clarifying an uncertain chemical state and in studying the electronic structure of the bonded atom.

Pulse-Height Selection in X-Ray Fluorescence

1960 ◽  
Vol 4 ◽  
pp. 370-381
Author(s):  
Kurt F.J. Heinrich
Keyword(s):  
Energy Levels ◽  
Pulse Height ◽  
Fluorescence Analysis ◽  
Higher Order ◽  
Pulse Height Analyzer ◽  
X Ray ◽  
Qualitative And Quantitative ◽  
Systematic Application ◽  
Pulse Height Analysis ◽  
Qualitative Work

AbstractPulse-height analysis is a valuable tool in X-ray fluorescence analysis, both for qualitative and quantitative purposes. The elimination of higher order interferences permits determinations that would otherwise be very difficult or impossible, The systematic application of pulse-height analysis in qualitative work greatly simplifies the interpretation of complex spectra. In certain cases one can apply nondispersive analysis, relying on the pulse-height analyzer alone for separating energy levels of X-ray photons. Technique and limitations of pulse-height analysis will be discussed.

scholarly journals X-Ray Emission Analysis by Pulse Height Analysis

RADIOISOTOPES ◽  
1964 ◽  
Vol 13 (5) ◽  
pp. 355-361 ◽  
Author(s):  
Hiroshi IMAMURA ◽  
Kaoru UCHIDA ◽  
Hiroshi TOMINAGA
Keyword(s):  
Pulse Height ◽  
Emission Analysis ◽  
X Ray ◽  
Pulse Height Analysis

RFX x‐ray pulse height analysis system

1990 ◽  
Vol 61 (10) ◽  
pp. 2801-2803 ◽  
Author(s):  
L. Carraro ◽  
M. Valisa
Keyword(s):  
Pulse Height ◽  
X Ray ◽  
Pulse Height Analysis ◽  
Analysis System

scholarly journals Electron temperature estimation using the Pulse Height Analysis system at Wendelstein 7-X stellarator

2018 ◽  
Vol 136 ◽  
pp. 1291-1294 ◽  
Author(s):  
Natalia Krawczyk ◽  
Monika Kubkowska ◽  
Agata Czarnecka ◽  
Slawomir Jablonski ◽  
Marta Gruca ◽  
...  
Keyword(s):  
Electron Temperature ◽  
Pulse Height ◽  
Temperature Estimation ◽  
Pulse Height Analysis ◽  
Analysis System
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