Low voltage electron emission from Pb(ZrxTi1−x)O3‐based thin film cathodes

1995 ◽  
Vol 66 (17) ◽  
pp. 2183-2185 ◽  
Author(s):  
O. Auciello ◽  
M. A. Ray ◽  
D. Palmer ◽  
J. Duarte ◽  
G. E. McGuire ◽  
...  
2002 ◽  
Vol 734 ◽  
Author(s):  
Lawrence F. Drummy ◽  
Paul K. Miska ◽  
David C. Martin

The aromatic hydrocarbon pentacene is currently under investigation for use as the active layer in electronic devices such as thin film field effect transistors. We have used X-Ray Diffraction (XRD), Electron Diffraction (ED), Low Voltage Electron Microscopy (LVEM), High Resolution Electron Microscopy (HREM) and molecular modeling to investigate the thin film phase of pentacene. We will report the orthorhombic symmetry and lattice parameters of the thin film phase measured experimentally from these techniques. The structure of extended defects such as dislocations and grain boundaries will influence the electrical and mechanical characteristics of the films. Here we show a direct image of an edge dislocation in the thin film phase and discuss the way in which the lattice accommodates the defect.


Carbon ◽  
2013 ◽  
Vol 57 ◽  
pp. 169-173 ◽  
Author(s):  
Pejman Hojati-Talemi ◽  
Stephen C. Hawkins ◽  
Chi P. Huynh ◽  
George P. Simon

2008 ◽  
Vol 6 ◽  
pp. 164-166 ◽  
Author(s):  
Adrian Ghemes ◽  
Crina Ghemes ◽  
Yoichiro Neo ◽  
Morihiro Okada ◽  
Toru Aoki ◽  
...  

2003 ◽  
Vol 97 (6) ◽  
pp. 1240-1245 ◽  
Author(s):  
Al. A. Zakhidov ◽  
A. N. Obraztsov ◽  
A. P. Volkov ◽  
D. A. Lyashenko

2008 ◽  
Vol 104 (1) ◽  
pp. 25-33 ◽  
Author(s):  
ADRIAN GHEMES ◽  
YOICHIRO NEO ◽  
MORIHIRO OKADA ◽  
TORU AOKI ◽  
HIDENORI MIMURA

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