Fast computer‐controlled deep level transient spectroscopy system for versatile applications in semiconductors

1986 ◽  
Vol 57 (7) ◽  
pp. 1373-1377 ◽  
Author(s):  
K. Hölzlein ◽  
G. Pensl ◽  
M. Schulz ◽  
P. Stolz
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Fast Computer ◽  
Computer Controlled ◽  
Spectroscopy System ◽  
Transient Spectroscopy

Development of Computer Controlled Deep Level Transient Spectroscopy System

1998 ◽  
Vol 15 (1-2) ◽  
pp. 105-110
Author(s):  
P N Reddy ◽  
B P N Reddy ◽  
S V Pandurangaiah ◽  
K S Chari
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Computer Controlled ◽  
Spectroscopy System ◽  
Transient Spectroscopy

Deep Level Transient Spectroscopy System

1989 ◽  
Vol 22 (18) ◽  
pp. 285-290
Author(s):  
F. Garcia-Perez ◽  
F.J. Sanchez ◽  
F. Sandoval
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Spectroscopy System ◽  
Transient Spectroscopy

Deep Level Transient Spectroscopy System Designed by LabVIEW

2013 ◽  
Vol 765-767 ◽  
pp. 2324-2328
Author(s):  
Jie Zhou ◽  
Lin Jun Wang ◽  
Xiao Xiang Sun ◽  
Jia Qi Teng ◽  
Bei Ling Yao ◽  
...  
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Lower Cost ◽  
Deep Level ◽  
Induced Current ◽  
Current Amplifier ◽  
Spectroscopy System ◽  
Transient Spectroscopy ◽  
Capacitance Meter ◽  
Theory Research ◽  
Impurities And Defects

Deep level transient spectroscopy (DLTS) and photo induced current transient spectroscopy (PICTS) are commonly used methods for the identification semiconductor impurities and defects. In this paper, a measurement system of DLTS and PICTS has been developed by LabVIEW. A series of different instruments construct this systems hardware (signal generator; current amplifier; capacitance meter; oscilloscope,etc.) while software is also easy to program by LabVIEW. This system demonstrates high generality for both DLTS and PICTS, and data acquired can be stored or read in computer. By contrast, it is much lower cost comparative to commercial DLTS or PICTS system. Testing result of silicon P+N junction coincides with semiconductor theory research.

A microcomputer based deep level transient spectroscopy system

1991 ◽  
Vol 80 (4) ◽  
pp. 247-249 ◽  
Author(s):  
E.K. Evangelou ◽  
A.D. Horevas ◽  
G.E. Giakoumakis ◽  
N.G. Alexandropoulos
Keyword(s):  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Spectroscopy System ◽  
Transient Spectroscopy

Deep-level-transient spectroscopy: System effects and data analysis

1979 ◽  
Vol 50 (8) ◽  
pp. 5093 ◽  
Author(s):  
D. S. Day ◽  
M. Y. Tsai ◽  
B. G. Streetman ◽  
D. V. Lang
Keyword(s):  
Data Analysis ◽  
Deep Level Transient Spectroscopy ◽  
Deep Level ◽  
Spectroscopy System ◽  
Transient Spectroscopy
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