Retarding‐field differential‐output energy prefilter for high‐performance secondary ion mass spectrometry

1985 ◽  
Vol 56 (8) ◽  
pp. 1557-1563 ◽  
Author(s):  
Patrick M. Thompson ◽  
James W. Taylor ◽  
Ronald E. Negri
Keyword(s):  
Mass Spectrometry ◽  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Output Energy ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

The Use of Secondary Ion Mass Spectrometry to Investigate Wire Bonding Yield Problems on Gold Contacts

1995 ◽  
Vol 390 ◽  
Author(s):  
G. R. Mount ◽  
T. L. Walzak ◽  
Y. C. Koo ◽  
D. McClure
Keyword(s):  
Mass Spectrometry ◽  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Low Cost ◽  
Gold Wire ◽  
Wire Bond ◽  
Bond Yield ◽  
Ion Mass Spectrometry ◽  
Bond Pads ◽  
Secondary Ion

ABSTRACTWith ongoing demand for high density wiring and high I/O on VLSI chips, the requirement of high wire bond yield is a challenge to achieve low cost, high performance and reliable products. Secondary Ion Mass Spectrometry (SIMS) was used to investigate the metallurgical contaminants on the gold wire bond pads and their impact on wire bond yields. SIMS depth profile studies showed that copper and nickel in concentrations greater than 1 wt% caused poor wire bondability, while copper concentration at less than 0.1 wt% resulted in good bondability of Al ultrasonic wire bonded to the gold pads.

scholarly journals Correlative fluorescence microscopy, transmission electron microscopy and secondary ion mass spectrometry (CLEM-SIMS) for cellular imaging

2020 ◽  
Author(s):  
Felix Lange ◽  
Paola Agüi-Gonzalez ◽  
Dietmar Riedel ◽  
Nhu T.N. Phan ◽  
Stefan Jakobs ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Mass Spectrometry ◽  
Fluorescence Microscopy ◽  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Cell Structure ◽  
Light And Electron Microscopy ◽  
Epifluorescence Microscopy ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

AbstractElectron microscopy (EM) has been employed for decades to analyze cell structure. To also analyze the positions and functions of specific proteins, one typically relies on immuno-EM or on a correlation with fluorescence microscopy, in the form of correlated light and electron microscopy (CLEM). Nevertheless, neither of these procedures is able to also address the isotopic composition of cells. To solve this, a correlation with secondary ion mass spectrometry (SIMS) would be necessary. SIMS has been correlated in the past to EM or to fluorescence microscopy in biological samples, but not to CLEM. We achieved this here, using a protocol based on transmission EM, conventional epifluorescence microscopy and nanoSIMS. The protocol is easily applied, and enables the use of all three technologies at high performance parameters. We suggest that CLEM-SIMS will provide substantial information that is currently beyond the scope of conventional correlative approaches.

Summary Abstract: High‐performance molecular secondary ion mass spectrometry (SIMS)

1982 ◽  
Vol 20 (4) ◽  
pp. 1068-1069 ◽  
Author(s):  
J. E. Campana ◽  
T. M. Barlak ◽  
J. R. Wyatt ◽  
J. J. DeCorpo ◽  
R. J. Colton
Keyword(s):  
Mass Spectrometry ◽  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Correlative fluorescence microscopy, transmission electron microscopy and secondary ion mass spectrometry (CLEM-SIMS) for cellular imaging

PLoS ONE ◽  
2021 ◽  
Vol 16 (5) ◽  
pp. e0240768
Author(s):  
Felix Lange ◽  
Paola Agüi-Gonzalez ◽  
Dietmar Riedel ◽  
Nhu T. N. Phan ◽  
Stefan Jakobs ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Mass Spectrometry ◽  
Fluorescence Microscopy ◽  
High Performance ◽  
Secondary Ion Mass Spectrometry ◽  
Cell Structure ◽  
Light And Electron Microscopy ◽  
Epifluorescence Microscopy ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Electron microscopy (EM) has been employed for decades to analyze cell structure. To also analyze the positions and functions of specific proteins, one typically relies on immuno-EM or on a correlation with fluorescence microscopy, in the form of correlated light and electron microscopy (CLEM). Nevertheless, neither of these procedures is able to also address the isotopic composition of cells. To solve this, a correlation with secondary ion mass spectrometry (SIMS) would be necessary. SIMS has been correlated in the past to EM or to fluorescence microscopy in biological samples, but not to CLEM. We achieved this here, using a protocol based on transmission EM, conventional epifluorescence microscopy and nanoSIMS. The protocol is easily applied, and enables the use of all three technologies at high performance parameters. We suggest that CLEM-SIMS will provide substantial information that is currently beyond the scope of conventional correlative approaches.

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