Grazing‐incidence differential‐reflectance method for explicit determination of the complex dielectric function of an isotropic absorbing medium

R. M. A. Azzam

doi:10.1063/1.1137490

Grazing‐incidence differential‐reflectance method for explicit determination of the complex dielectric function of an isotropic absorbing medium

Review of Scientific Instruments ◽

10.1063/1.1137490 ◽

1983 ◽

Vol 54 (7) ◽

pp. 853-855 ◽

Cited By ~ 5

Author(s):

R. M. A. Azzam

Keyword(s):

Dielectric Function ◽

Grazing Incidence ◽

Complex Dielectric Function ◽

Absorbing Medium ◽

Explicit Determination

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Determination of the complex dielectric function of an unbacked or embedded thin film by grazing-incidence reflection or transmission ellipsometry

Optics Communications ◽

10.1016/0030-4018(90)90368-4 ◽

1990 ◽

Vol 80 (2) ◽

pp. 103-106 ◽

Cited By ~ 1

Author(s):

R.M.A. Azzam

Keyword(s):

Thin Film ◽

Dielectric Function ◽

Grazing Incidence ◽

Complex Dielectric Function

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Analytical determination of the complex dielectric function of an absorbing medium from two angles of incidence of minimum parallel reflectance

Journal of the Optical Society of America A ◽

10.1364/josaa.6.001213 ◽

1989 ◽

Vol 6 (8) ◽

pp. 1213 ◽

Cited By ~ 9

Author(s):

R. M. A. Azzam

Keyword(s):

Dielectric Function ◽

Analytical Determination ◽

Complex Dielectric Function ◽

Absorbing Medium

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Determination of complex dielectric function of CH3NH3PbBr3 perovskite cubic colloidal quantum dots by modified iterative matrix inversion method

Optics Express ◽

10.1364/oe.27.020098 ◽

2019 ◽

Vol 27 (15) ◽

pp. 20098

Author(s):

Hee Chul Woo ◽

Jin Woo Choi ◽

Jae-Suk Lee ◽

Chang-Lyoul Lee

Keyword(s):

Quantum Dots ◽

Dielectric Function ◽

Matrix Inversion ◽

Colloidal Quantum Dots ◽

Inversion Method ◽

Complex Dielectric Function ◽

Matrix Inversion Method

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Determination of the complex dielectric function of ion implanted amorphous SiC by spectroscopic ellipsometry

phys stat sol (a) ◽

10.1002/pssa.200306277 ◽

2003 ◽

Vol 195 (1) ◽

pp. 277-281 ◽

Cited By ~ 5

Author(s):

E. R. Shaaban ◽

T. Lohner ◽

P. Petrik ◽

N. Q. Khánh ◽

M. Fried ◽

...

Keyword(s):

Dielectric Function ◽

Spectroscopic Ellipsometry ◽

Complex Dielectric Function ◽

Amorphous Sic ◽

Ion Implanted

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Erratum: “Determination of the complex dielectric function of epitaxial SrTiO3 films using transmission electron energy-loss spectroscopy” [J. Appl. Phys. 85, 2828 (1999)]

Journal of Applied Physics ◽

10.1063/1.370862 ◽

1999 ◽

Vol 86 (2) ◽

pp. 1172-1172

Author(s):

L. Ryen ◽

X. Wang ◽

U. Helmersson ◽

E. Olsson

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Dielectric Function ◽

Electron Energy Loss Spectroscopy ◽

Complex Dielectric Function ◽

Transmission Electron ◽

Electron Energy Loss

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Explicit determination of the complex refractive index of an absorbing medium from reflectance measurements at and near normal incidence

Journal of the Optical Society of America ◽

10.1364/josa.72.001439 ◽

1982 ◽

Vol 72 (10) ◽

pp. 1439 ◽

Cited By ~ 11

Author(s):

R. M. A. Azzam

Keyword(s):

Refractive Index ◽

Complex Refractive Index ◽

Normal Incidence ◽

Absorbing Medium ◽

Explicit Determination ◽

Reflectance Measurements

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Quantitative Determination of Complex Dielectric Function of Amorphous Silicon Dioxide on Silicon Substrate from Transmission Spectrum

Japanese Journal of Applied Physics ◽

10.1143/jjap.48.121406 ◽

2009 ◽

Vol 48 (12) ◽

pp. 121406 ◽

Cited By ~ 3

Author(s):

Yasuhisa Kayaba ◽

Takamaro Kikkawa

Keyword(s):

Silicon Dioxide ◽

Quantitative Determination ◽

Amorphous Silicon ◽

Dielectric Function ◽

Transmission Spectrum ◽

Silicon Substrate ◽

Complex Dielectric Function ◽

Amorphous Silicon Dioxide

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Determination of the complex dielectric function of CdTe(110)1 × 1 surface by polarized surface differential reflectivity

Surface Science ◽

10.1016/0039-6028(95)00123-9 ◽

1995 ◽

Vol 331-333 ◽

pp. 1172-1175 ◽

Cited By ~ 2

Author(s):

A. Cricenti ◽

A.C. Felici

Keyword(s):

Dielectric Function ◽

Complex Dielectric Function ◽

Polarized Surface ◽

Differential Reflectivity

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Determination of the complex dielectric function of Si(111) 2 × 1, GaAs(110) and GaP(110) surfaces by polarized surface differential reflectivity

Physica Scripta ◽

10.1088/0031-8949/38/2/017 ◽

1988 ◽

Vol 38 (2) ◽

pp. 199-203 ◽

Cited By ~ 28

Author(s):

A Cricenti ◽

S Selci ◽

F Ciccacci ◽

A C Felici ◽

C Goletti ◽

...

Keyword(s):

Dielectric Function ◽

Complex Dielectric Function ◽

Polarized Surface ◽

Differential Reflectivity

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Determination of the complex dielectric function of epitaxial SrTiO3 films using transmission electron energy-loss spectroscopy

Journal of Applied Physics ◽

10.1063/1.369602 ◽

1999 ◽

Vol 85 (5) ◽

pp. 2828-2834 ◽

Cited By ~ 25

Author(s):

L. Ryen ◽

X. Wang ◽

U. Helmersson ◽

E. Olsson

Keyword(s):

Energy Loss ◽

Electron Energy ◽

Dielectric Function ◽

Electron Energy Loss Spectroscopy ◽

Complex Dielectric Function ◽

Transmission Electron ◽

Electron Energy Loss

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