New Kerr cell for low‐temperature measurements

J. Crossley; B. K. Morgan; M. Rujimethabhas

doi:10.1063/1.1135715

New Kerr cell for low‐temperature measurements

Review of Scientific Instruments ◽

10.1063/1.1135715 ◽

1979 ◽

Vol 50 (11) ◽

pp. 1400-1402 ◽

Cited By ~ 9

Author(s):

J. Crossley ◽

B. K. Morgan ◽

M. Rujimethabhas

Keyword(s):

Low Temperature ◽

Temperature Measurements ◽

Kerr Cell

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A simple energy balance to determine heat transfer coefficients from low temperature measurements in a fluidised bed

Powder Technology ◽

10.1016/j.powtec.2005.08.022 ◽

2006 ◽

Vol 161 (1) ◽

pp. 53-58 ◽

Cited By ~ 2

Author(s):

Y. Suyadal

Keyword(s):

Heat Transfer ◽

Energy Balance ◽

Low Temperature ◽

Temperature Measurements ◽

Fluidised Bed ◽

Transfer Coefficients ◽

Heat Transfer Coefficients

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Low Temperature Measurements by Rotational Raman Scattering

Laser Raman Gas Diagnostics ◽

10.1007/978-1-4684-2103-3_11 ◽

1974 ◽

pp. 179-188

Author(s):

Jack A. Salzman

Keyword(s):

Low Temperature ◽

Raman Scattering ◽

Temperature Measurements

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Low-temperature measurements of HCN broadened by N2 in the 14-μm spectral region

Journal of Quantitative Spectroscopy and Radiative Transfer ◽

10.1016/j.jqsrt.2007.12.017 ◽

2008 ◽

Vol 109 (6) ◽

pp. 922-951 ◽

Cited By ~ 5

Author(s):

M.A.H. Smith ◽

C.P. Rinsland ◽

T.A. Blake ◽

R.L. Sams ◽

D.Chris Benner ◽

...

Keyword(s):

Low Temperature ◽

Spectral Region ◽

Temperature Measurements

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Temperature measurements in the low temperature combustion of n-pentane

Combustion and Flame ◽

10.1016/0010-2180(68)90063-1 ◽

1968 ◽

Vol 12 (5) ◽

pp. 499-501 ◽

Cited By ~ 1

Author(s):

R. Hughes ◽

R.F. Simmons

Keyword(s):

Low Temperature ◽

Temperature Measurements ◽

Low Temperature Combustion ◽

Temperature Combustion

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Crossed‐Coil Nuclear Magnetic Resonance Probe for High Sensitivity Low Temperature Measurements

Review of Scientific Instruments ◽

10.1063/1.1685514 ◽

1972 ◽

Vol 43 (11) ◽

pp. 1648-1650 ◽

Cited By ~ 3

Author(s):

L. E. Drain

Keyword(s):

Nuclear Magnetic Resonance ◽

Magnetic Resonance ◽

Low Temperature ◽

High Sensitivity ◽

Temperature Measurements ◽

Nuclear Magnetic Resonance Probe ◽

Nuclear Magnetic

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Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing Experimental Techniques for Low-Temperature Measurements: Cryostat Design, Material Properties, and Superconductor Critical-Current Testing , Jack W. Ekin , Oxford U. Press, New York, 2006. $125.00 (673 pp.). ISBN 978-0-19-857054-7

Physics Today ◽

10.1063/1.2743130 ◽

2007 ◽

Vol 60 (5) ◽

pp. 67-68

Author(s):

George O. Zimmerman

Keyword(s):

New York ◽

Low Temperature ◽

Critical Current ◽

Material Properties ◽

Temperature Measurements ◽

Experimental Techniques ◽

Current Testing

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A study of variable range hopping conduction of a sol-gel ZnSnO thin film transistor using low temperature measurements

Physica B Condensed Matter ◽

10.1016/j.physb.2019.05.036 ◽

2019 ◽

Vol 569 ◽

pp. 80-86 ◽

Cited By ~ 1

Author(s):

Chih-Chieh Hsu ◽

Cheng-Han Chou ◽

Wun-Ciang Jhang ◽

Po-Tsung Chen

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistor ◽

Sol Gel ◽

Temperature Measurements ◽

Hopping Conduction ◽

Variable Range Hopping ◽

Variable Range ◽

Variable Range Hopping Conduction

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A resonator for low-temperature measurements at 3.2 cm wavelength

Cryogenics ◽

10.1016/0011-2275(65)90123-2 ◽

1965 ◽

Vol 5 (5) ◽

pp. 277-278 ◽

Cited By ~ 1

Author(s):

A.L Bil'dyukevich

Keyword(s):

Low Temperature ◽

Temperature Measurements

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Low temperature measurements of the dielectric constant and loss of boron doped silicon

Physica B Condensed Matter ◽

10.1016/0921-4526(94)90869-9 ◽

1994 ◽

Vol 194-196 ◽

pp. 1079-1080

Author(s):

R.D. Biggar ◽

K.R. Lane ◽

J.M. Parpia

Keyword(s):

Dielectric Constant ◽

Low Temperature ◽

Temperature Measurements ◽

Boron Doped ◽

Dielectric Constant And Loss ◽

Doped Silicon

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Evidence of Deep Energy States from Low Temperature Measurements and Its Role in Charge Trapping in Metal Gate/Hf-Silicate Gate Stacks

ECS Transactions ◽

10.1149/1.2209322 ◽

2019 ◽

Vol 1 (5) ◽

pp. 767-775 ◽

Cited By ~ 1

Author(s):

Naser A. Chowdhury ◽

Purushothaman Srinivasan ◽

D. Misra

Keyword(s):

Low Temperature ◽

Charge Trapping ◽

Temperature Measurements ◽

Gate Stacks ◽

Metal Gate ◽

Energy States

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