Near field emission scanning tunneling microscopy

Juan José Sáenz; Ricardo García

doi:10.1063/1.112496

Near field emission scanning tunneling microscopy

Applied Physics Letters ◽

10.1063/1.112496 ◽

1994 ◽

Vol 65 (23) ◽

pp. 3022-3024 ◽

Cited By ~ 31

Author(s):

Juan José Sáenz ◽

Ricardo García

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Near Field ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Single-atom point source for electrons: Field-emission resonance tunneling in scanning tunneling microscopy

Physical Review B ◽

10.1103/physrevb.47.12832 ◽

1993 ◽

Vol 47 (19) ◽

pp. 12832-12839 ◽

Cited By ~ 22

Author(s):

J. W. Gadzuk

Keyword(s):

Point Source ◽

Scanning Tunneling Microscopy ◽

Field Emission ◽

Single Atom ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Resonance Tunneling

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Near‐field magneto‐optical imaging in scanning tunneling microscopy

Applied Physics Letters ◽

10.1063/1.113839 ◽

1995 ◽

Vol 66 (9) ◽

pp. 1141-1143 ◽

Cited By ~ 34

Author(s):

M. W. J. Prins ◽

R. H. M. Groeneveld ◽

D. L. Abraham ◽

H. van Kempen ◽

H. W. van Kesteren

Keyword(s):

Scanning Tunneling Microscopy ◽

Optical Imaging ◽

Near Field ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Studies of individual nanometer‐sized metallic clusters using scanning tunneling microscopy, field emission, and field ion microscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576156 ◽

1989 ◽

Vol 7 (4) ◽

pp. 2845-2849 ◽

Cited By ~ 29

Author(s):

T. Castro ◽

Y. Z. Li ◽

R. Reifenberger ◽

E. Choi ◽

S. B. Park ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Field Ion Microscopy ◽

Metallic Clusters ◽

Ion Microscopy

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Scanning tunneling microscopy observations of hafnium carbide thin films as a field emission material

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.1849192 ◽

2005 ◽

Vol 23 (2) ◽

pp. 741 ◽

Cited By ~ 6

Author(s):

T. Sato ◽

M. Saida ◽

K. Horikawa ◽

M. Sasaki ◽

M. Nagao ◽

...

Keyword(s):

Thin Films ◽

Scanning Tunneling Microscopy ◽

Field Emission ◽

Scanning Tunneling ◽

Hafnium Carbide ◽

Tunneling Microscopy

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Unusual mosaic image of theSi(111)−(7×7)surface coinciding with field emission resonance in scanning tunneling microscopy

Physical Review B ◽

10.1103/physrevb.77.205301 ◽

2008 ◽

Vol 77 (20) ◽

Cited By ~ 6

Author(s):

Keisuke Sagisaka ◽

Daisuke Fujita

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Mosaic Image

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Polarization-dependent contrast of near-field and far-field-propagating signal intensities in C-mode scanning near-field optical microscopy/photon scanning tunneling microscopy

Optical Review ◽

10.1007/bf02932044 ◽

1996 ◽

Vol 3 (6) ◽

pp. 447-449 ◽

Cited By ~ 2

Author(s):

Kiyoshi Kobayashi ◽

Osaaki Watanuki

Keyword(s):

Scanning Tunneling Microscopy ◽

Optical Microscopy ◽

Near Field ◽

Scanning Tunneling ◽

Far Field ◽

Tunneling Microscopy ◽

Signal Intensities

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Spin-polarized scanning tunneling microscopy in field emission mode

Applied Physics Letters ◽

10.1063/1.2753695 ◽

2007 ◽

Vol 91 (1) ◽

pp. 012508 ◽

Cited By ~ 20

Author(s):

A. Kubetzka ◽

M. Bode ◽

R. Wiesendanger

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Spin Polarized ◽

Emission Mode

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The Tetrahedral Tip as a Probe for Scanning Near-Field Optical and for Scanning Tunneling Microscopy

Photons and Local Probes ◽

10.1007/978-94-011-0423-4_6 ◽

1995 ◽

pp. 79-92 ◽

Cited By ~ 5

Author(s):

J. Koglin ◽

U. C. Fischer ◽

K. D. Brzoska ◽

W. Göhde ◽

H. Fuchs

Keyword(s):

Scanning Tunneling Microscopy ◽

Near Field ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Vectorial, non-destructive magnetic imaging with scanning tunneling microscopy in the field emission regime

Applied Physics Letters ◽

10.1063/1.5117895 ◽

2019 ◽

Vol 115 (11) ◽

pp. 112402 ◽

Cited By ~ 1

Author(s):

U. Ramsperger ◽

D. Pescia

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Magnetic Imaging ◽

Non Destructive

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Measurement of Field Emission Property on the Individual Silicon Nanowire by Scanning Tunneling Microscopy

2006 19th International Vacuum Nanoelectronics Conference ◽

10.1109/ivnc.2006.335466 ◽

2006 ◽

Author(s):

W W Ming ◽

Jian Chen ◽

J C She ◽

J Zhou ◽

W G Xie ◽

...

Keyword(s):

Scanning Tunneling Microscopy ◽

Field Emission ◽

Silicon Nanowire ◽

Emission Property ◽

Field Emission Property ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

The Individual

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