Evidence for donor‐gallium vacancy pairs in silicon doped GaAs grown by molecular beam epitaxy at low temperatures

1992 ◽  
Vol 61 (25) ◽  
pp. 3008-3010 ◽  
Author(s):  
S. A. McQuaid ◽  
R. C. Newman ◽  
M. Missous ◽  
S. O’Hagan
1999 ◽  
Vol 33 (10) ◽  
pp. 1080-1083 ◽  
Author(s):  
A. E. Kunitsyn ◽  
V. V. Chaldyshev ◽  
S. P. Vul’ ◽  
V. V. Preobrazhenskii ◽  
M. A. Putyato ◽  
...  

1996 ◽  
Vol 69 (3) ◽  
pp. 397-399 ◽  
Author(s):  
Albert Chin ◽  
W. J. Chen ◽  
F. Ganikhanov ◽  
G.‐R. Lin ◽  
Jia‐Min Shieh ◽  
...  

1994 ◽  
Vol 49 (7) ◽  
pp. 4689-4694 ◽  
Author(s):  
P. W. Yu ◽  
G. D. Robinson ◽  
J. R. Sizelove ◽  
C. E. Stutz

1997 ◽  
Vol 40 (2) ◽  
pp. 214-218
Author(s):  
Nuofu Chen ◽  
Hongjia He ◽  
Yutian Wang ◽  
Lanying Lin

1992 ◽  
Vol 281 ◽  
Author(s):  
S. Arscott ◽  
M. Missous ◽  
L. Dobaczewski ◽  
P. C. Harness ◽  
D. K. Maude ◽  
...  

ABSTRACTShubnikov-de Haas and Hall measurements have been performed on singly delta doped GaAs(Si) structures, grown by molecular beam epitaxy, enabling us to study the effects of illumination and temperature upon bulk and individual subband, mobilities and carrier concentrations. In a highly doped sample, where the peak 3D electron concentration approaches 2×1019cm−3, we have observed novel changes in subband transport characteristics, not observed in the lower doped samples, which we attribute to the presence of DX centre phenomena. This paper explains the variations in individual subband transport properties due to a possible shift of the electronic wave functions contained in the potential well. This shift occurs due to a recombination-autoionization(R-A) process involving filled DX centres and free holes upon sample illumination at low temperatures.


1993 ◽  
Vol 63 (17) ◽  
pp. 2408-2410 ◽  
Author(s):  
H. Jorke ◽  
H. Kibbel ◽  
K. Strohm ◽  
E. Kasper

1992 ◽  
Vol 60 (24) ◽  
pp. 3007-3009 ◽  
Author(s):  
R. Enrique Viturro ◽  
Michael R. Melloch ◽  
Jerry M. Woodall

Sign in / Sign up

Export Citation Format

Share Document