Measurements of film carrier lifetimes in silicon‐on‐insulator wafers by a contactless dual‐beam optical modulation technique
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1992 ◽
Vol 35
(7)
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pp. 927-932
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1995 ◽
Vol 38
(7)
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pp. 1359-1366
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2013 ◽
Vol 5
(1)
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pp. 2200211-2200211
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