180° surface domain wall magnetization profiles: Comparisons between scanning electron microscopy with polarization analysis measurements, magneto‐optic Kerr microscopy measurements and micromagnetic models

1990 ◽  
Vol 57 (17) ◽  
pp. 1817-1819 ◽  
Author(s):  
M. R. Scheinfein ◽  
P. J. Ryan ◽  
J. Unguris ◽  
D. T. Pierce ◽  
R. J. Celotta
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Domain Wall ◽  
Polarization Analysis ◽  
Scanning Electron ◽  
Magneto Optic

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

Scanning electron microscopy with polarization analysis: An update

1991 ◽  
Vol 49 ◽  
pp. 764-765
Author(s):  
J. Unguris ◽  
M. W. Hart ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Domain Walls ◽  
Domain Wall Motion ◽  
Optical Recording ◽  
Polarization Analysis ◽  
Magnetic Domains ◽  
Magnetic Microstructure ◽  
Domain Structures ◽  
Scanning Electron

Over the past ten years the technique of scanning electron microscopy with polarization analysis (SEMPA) has rapidly evolved from a scientific curiosity to a useful analytical tool for looking at a material's magnetic microstructure. Several reviews of the technique have been published elsewhere. SEMPA has been successfully used to analyze various technological problems such as: noise in magnetic and magneto-optical recording media, domain wall motion in thin film recording heads, and domain structures in small Permalloy shapes. Basic science applications of SEMPA include quantitative studies of the influence of the surface on the structure of magnetic domains and domain walls, and studies of magnetic microstructures in ultra-thin (0.1 - 1 nm) ferromagnetic films. Many current applications of SEMPA make use of the technique's surface sensitivity to probe the magnetism of thin films and multilayers.

scholarly journals Depth Profiling Magnetic Structure Using Scanning Electron Microscopy with Polarization Analysis (SEMPA)

2010 ◽  
Vol 16 (S2) ◽  
pp. 1862-1863 ◽  
Author(s):  
B McMorran ◽  
D Pierce ◽  
J Unguris
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Magnetic Structure ◽  
Depth Profiling ◽  
Polarization Analysis ◽  
Scanning Electron

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

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