Preferential propagation of pores during the formation of porous silicon: A transmission electron microscopy study

1989 ◽  
Vol 55 (7) ◽  
pp. 675-677 ◽  
Author(s):  
S.‐F. Chuang ◽  
S. D. Collins ◽  
R. L. Smith
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Porous Silicon ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron

A transmission electron microscopy study of lattice defects in Mn3O4 hausmannite

1994 ◽  
Vol 70 (5) ◽  
pp. 1077-1094 ◽  
Author(s):  
J. J. Couderc ◽  
S. Fritsch ◽  
M. Brieu ◽  
G. Vanderschaeve ◽  
M. Fagot ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Lattice Defects ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron
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