Transmission electron microscopy study of the formation of a contamination layer on the surface of porous silicon

1994 ◽  
Vol 5 (5) ◽  
pp. 280-283
Author(s):  
J. Katcki ◽  
M. Bugajski
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Porous Silicon ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron

A transmission electron microscopy study of lattice defects in Mn3O4 hausmannite

1994 ◽  
Vol 70 (5) ◽  
pp. 1077-1094 ◽  
Author(s):  
J. J. Couderc ◽  
S. Fritsch ◽  
M. Brieu ◽  
G. Vanderschaeve ◽  
M. Fagot ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Lattice Defects ◽  
Transmission Electron Microscopy Study ◽  
Transmission Electron
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