A stablen‐channel indium phosphide field‐effect transistor with an amorphous hydrogenated silicon gate

1989 ◽  
Vol 55 (10) ◽  
pp. 999-1001 ◽  
Author(s):  
E. Roditi ◽  
A. A. Iliadis ◽  
A. Christou
1989 ◽  
Vol 160 ◽  
Author(s):  
E. Roditi ◽  
A.A. Iliadis ◽  
A. Christou

AbstractInP field-effect transistors fabricated with an amorphous hydrogenated Si (a-Si:H) gate resulted in metal-insulator-like FET characteristics with no observable current drift and a transconductance of 30–38 mS/mm. The high stability of this gate system is attributed to the low temperature of deposition and the hydrogen passivation of the InP surface.


2020 ◽  
Vol 384 (19) ◽  
pp. 126498 ◽  
Author(s):  
Gul Faroz A. Malik ◽  
Mubashir A. Kharadi ◽  
Farooq A. Khanday ◽  
Khurshed A. Shah

1990 ◽  
Author(s):  
C.R. Zeisse ◽  
R. Nguyen ◽  
T.T. Vu ◽  
L.J. Messick ◽  
K.L. Moazed

Author(s):  
Linqiang Xu ◽  
Ruge Quhe ◽  
Qiuhui Li ◽  
Shiqi Liu ◽  
Jie Yang ◽  
...  

Indium phosphide (InP) has higher electron mobility, electron saturation velocity, and drain current than silicon (Si), and the ultra-thin (UT) InP field-effect transistor (FET) probably possesses a better device performance...


1989 ◽  
Vol 10 (8) ◽  
pp. 358-360 ◽  
Author(s):  
C.R. Zeisse ◽  
R. Nguyen ◽  
L.J. Messick ◽  
P. Saunier ◽  
K.L. Moazed

2010 ◽  
Vol E93-C (5) ◽  
pp. 540-545 ◽  
Author(s):  
Dong Seup LEE ◽  
Hong-Seon YANG ◽  
Kwon-Chil KANG ◽  
Joung-Eob LEE ◽  
Jung Han LEE ◽  
...  

2014 ◽  
Vol E97.C (7) ◽  
pp. 677-682
Author(s):  
Sung YUN WOO ◽  
Young JUN YOON ◽  
Jae HWA SEO ◽  
Gwan MIN YOO ◽  
Seongjae CHO ◽  
...  

2019 ◽  
Vol 24 (4) ◽  
pp. 407-414
Author(s):  
Oksana V. Gubanova ◽  
◽  
Evgeniy V. Kuznetsov ◽  
Elena N. Rybachek ◽  
Alexander N. Saurov ◽  
...  

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